Abstract:Crystalline growth from melt during microthermal-plasma-jet (µ-TPJ) irradiation to amorphous silicon (a-Si) film has been directly observed by highspeed camera. Long lateral growth perpendicular to the oval-shaped liquid-solid interface results in formation of random grain boundaries (GBs). Introduction of strip pattern markedly reduces random GBs and enables singlecrystalline growth at predetermined channel regions. Nand p-channel thin-film transistors (TFTs) showed high performance and small characteristic v… Show more
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