2016
DOI: 10.1002/ppap.201600143
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Atmospheric pressure roll‐to‐roll plasma enhanced CVD of high quality silica‐like bilayer encapsulation films

Abstract: A glow like atmospheric pressure dielectric barrier discharge in a roll‐to‐roll setup was used to synthesize 90 nm silica‐like bilayer encapsulation films composed of a 30 nm dense “barrier layer” and a comparatively less dense 60 nm “buffer layer” onto a polyethylene 2,6 naphthalate substrate by means of plasma enhanced chemical vapor deposition. Tetraethyl orthosilicate was used as the precursor gas, together with a mixture of nitrogen, oxygen, and argon. The microstructure, chemical composition, morphology,… Show more

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Cited by 22 publications
(35 citation statements)
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“…Because the power density remains unvaried, the specific energy delivered per precursor molecule (related to Yasuda parameter) is constant. For the current experimental conditions the DDR is around 75 to 80 nm·mm·s −1 (for Q = 10-30 slm) and the estimated energy spent per TEOS molecule is 6.5 keV/molecule, the specifics of the calculation can be found in [5,28]. The gradual decrease in the calculated DDR value from the static profiles with increasing gas flow is mainly attributed to a slight increase in the gas loss due to stronger convection, see Fig.…”
Section: Static Profile Analysismentioning
confidence: 75%
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“…Because the power density remains unvaried, the specific energy delivered per precursor molecule (related to Yasuda parameter) is constant. For the current experimental conditions the DDR is around 75 to 80 nm·mm·s −1 (for Q = 10-30 slm) and the estimated energy spent per TEOS molecule is 6.5 keV/molecule, the specifics of the calculation can be found in [5,28]. The gradual decrease in the calculated DDR value from the static profiles with increasing gas flow is mainly attributed to a slight increase in the gas loss due to stronger convection, see Fig.…”
Section: Static Profile Analysismentioning
confidence: 75%
“…The increase in density of small (~1 μm) pinhole defects [28] must be the main reason for the gradual deterioration of the WVTR values for Q > 25 slm.…”
Section: Dynamically Deposited Filmsmentioning
confidence: 99%
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“…According to the fast imaging analysis, during the single current pulse, this transient discharge evolved from a 'Townsend-like' mode to a 'glow-like' mode for each half cycle of the electric field [11,12]. It was also demonstrated that application of such a diffuse discharge as a plasma source for the roll-to-roll AP-PECVD process in conjunction with organosilicon precursors results in high quality inorganic silica-like thin films, which can be deposited on thermally sensitive polymeric substrates [14][15][16]. In this process, the increased discharge power density allows the synthesis of silica-like films with improved microstructure, lower impurities level and excellent gas diffusion barrier properties [16,17].…”
mentioning
confidence: 97%
“…It was also demonstrated that application of such a diffuse discharge as a plasma source for the roll-to-roll AP-PECVD process in conjunction with organosilicon precursors results in high quality inorganic silica-like thin films, which can be deposited on thermally sensitive polymeric substrates [14][15][16]. In this process, the increased discharge power density allows the synthesis of silica-like films with improved microstructure, lower impurities level and excellent gas diffusion barrier properties [16,17]. Moreover, a higher power density is also required to increase the deposition rate and therefore the throughput of the PECVD process.…”
mentioning
confidence: 99%