1977
DOI: 10.2172/7112109
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Atomic data for controlled fusion research

Abstract: 22. Cross S :tiona for Formation of H Atoms in High Excited States by H* Impact on la, 1%, K, and Cm .... A.2.U 23. Excitation Cross Sections for the Reactions V Eg** H 2-H(2«,3s f 2p,3p,3 Show more

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Cited by 63 publications
(38 citation statements)
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“…A third possible process [which is indistinguishable from (2) in our experiment] involves the formation of the positronium negative ion Ps 2 . Comparing to equivelocity proton data [2][3][4], the cross section for this double electron capture is expected to be very small, and it will not be considered further here.…”
Section: Strong Suppression Of the Positronium Channel In Double Ionimentioning
confidence: 99%
“…A third possible process [which is indistinguishable from (2) in our experiment] involves the formation of the positronium negative ion Ps 2 . Comparing to equivelocity proton data [2][3][4], the cross section for this double electron capture is expected to be very small, and it will not be considered further here.…”
Section: Strong Suppression Of the Positronium Channel In Double Ionimentioning
confidence: 99%
“…Sputtering yields were given by Sigmund [5]. These values are, however, several times higher than the experimental data for other heavy ions [6,7]; we have, therefore, divided Sigmund's sputtering yields by two for these calculations, S o . The energy and the angular distributions of sputtered impurity atoms were assumed to be:…”
Section: Resultsmentioning
confidence: 97%
“…The probability of an electron in group 1 colliding with a neutral before being lost is Figure 5 shows the total electron-neutral crosssections for molecular hydrogen and helium as well as the ionization cross-sections for various noble gases reproduced directly from Ref. [10]. Note that atomic cross-sections are very nearly the same for different isotopes.…”
Section: -S -(4)mentioning
confidence: 97%
“…5, and are taken directly from Ref. [10]. The most important parameter to determine in a specific device is |E_|.…”
Section: T3 I X\0 6 P S'mentioning
confidence: 99%