Nanocharacterization Techniques 2017
DOI: 10.1016/b978-0-323-49778-7.00002-3
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Atomic Force Microscopy: A Powerful Tool for Electrical Characterization

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Cited by 7 publications
(3 citation statements)
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“…The principle of non-destructive electrical contact relies on the physics underlying the non-destructive measurement mode in atomic force microscopy (AFM) [ 14 , 32 , 33 ]. Figure 3 depicts a typical force curve in AFM.…”
Section: Concept Of Non-destructive Robust Electrical Contactmentioning
confidence: 99%
See 1 more Smart Citation
“…The principle of non-destructive electrical contact relies on the physics underlying the non-destructive measurement mode in atomic force microscopy (AFM) [ 14 , 32 , 33 ]. Figure 3 depicts a typical force curve in AFM.…”
Section: Concept Of Non-destructive Robust Electrical Contactmentioning
confidence: 99%
“…A commercially available prober that uses metal needles as a probe, such as in Figure 1 a, scratches specimens and damages the surface, as seen in Figure 1 b. Therefore, metal evaporation [ 1 , 12 , 13 ] or conductive AFM (atomic force microscopy) [ 14 , 15 , 16 , 17 ] has usually been employed to make electrical contact with specimens. However, these methods have drawbacks: metal evaporation contaminates specimens, preventing further measurements, and AFM requires precise feedback.…”
Section: Introductionmentioning
confidence: 99%
“…AFM is another microscopy technique that has been commonly used to inspect nanoemulsion‐containing films, particularly to investigate their surface roughness. This technique relies upon a sensing probe that passes over the film surface, interacting with it and generating a scanning signal, which is finally converted into 3D images that allow to discern the topographic features of the studied sample (Tararam, Garcia, Deda, Varela, & de Lima Leite, ). In most cases, AFM is used together with SEM, the former allowing the quantification of surface roughness (Alexandre et al., ; Chen et al., ; Imran et al., ; Pérez‐Córdoba et al., ).…”
Section: Characterization Of Nanoemulsion‐containing Food Packaging Mmentioning
confidence: 99%