2011
DOI: 10.1016/j.jelechem.2011.07.014
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Atomic force microscopy and infrared analysis of aging processes of polymer electrolyte membrane fuel cell components

Abstract: In this contribution, the possibilities and limits of atomic force microscopy (AFM) for investigation of fuel cell component degradation are evaluated. In particular the adhesion force and dissipation energy of the surface measured by a material sensitive AFM technique -the HarmoniX-mode (Bruker Corp.) -have been used as a measure for the relative polytetrafluoroethylene (PTFE) content of surfaces and could be quantified by calibrating with sample of known composition. Differently operated samples with micropo… Show more

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Cited by 13 publications
(9 citation statements)
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“…8b, the formation of differently adhesive structures, hydrophobic/PTFE-rich and hydrophilic/waterrich, both orientated parallel to the interface, is visible. Higher adhesion values typically indicates a higher PTFE-like content [46], which in this case, is associated with a backbone-rich phase; low adhesion indicates a water-rich phase, as discussed above. Close to the interface, more of the higher adhesive water-poor phase is present, which agrees with measurements at membranes [21].…”
Section: Interface Formation Of Ionomer Layer To Hydrophobic and Hydrmentioning
confidence: 83%
“…8b, the formation of differently adhesive structures, hydrophobic/PTFE-rich and hydrophilic/waterrich, both orientated parallel to the interface, is visible. Higher adhesion values typically indicates a higher PTFE-like content [46], which in this case, is associated with a backbone-rich phase; low adhesion indicates a water-rich phase, as discussed above. Close to the interface, more of the higher adhesive water-poor phase is present, which agrees with measurements at membranes [21].…”
Section: Interface Formation Of Ionomer Layer To Hydrophobic and Hydrmentioning
confidence: 83%
“…With respect to controlling the residual energy of the sputtered particle, the deposition parameters of substrate temperature, gas pressure and sputter power are commonly varied, while the substrate mechanical properties are not considered. In the context of this study, the relative dissipation energy was mapped for the different hard‐coat samples using an AFM using PeakForce mode. Figure illustrates the difference in dissipation energy measured by the AFM tip as it scans across the respective surfaces.…”
Section: Resultsmentioning
confidence: 99%
“…The indentation test was conducted with scanning probe microscopy (SPM, AFM5100N, Hitachi High-Technologies Corp., Japan) in force curve mode to determine the indentation stiffness of the sample surface. Sample surface stiffness (modulus of the sample surface) is given by the slope ΔF, the reaction force that a cantilever receives by tapping on the sample surface/ΔD, displacement of a cantilever by bending, of the reaction curve [16]. The lower the ΔF/ΔD, the softer is the sample surface [17].…”
Section: Characterizationmentioning
confidence: 99%