2024
DOI: 10.21203/rs.3.rs-4934376/v1
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Atomic force microscopy and scanning electron microscopy for characterization of interface surface roughness after ELITA femtosecond laser treatments

Hajime Minoguchi,
Miguel Teus,
Hong Fu

Abstract: Purpose To characterize and compare the corneal interface surface roughness of the ELITA femtosecond laser flap and smooth incision lenticular keratomileusis (SILK) to iFS femtosecond laser flap with atomic force microscopy (AFM) and scanning electron microscopy (SEM). Methods The iFS flap with 700 nJ pulse energy, ELITA flap with 50 nJ, and ELITA SILK with 50 nJ were performed on ex-vivo porcine eyes. After the femtosecond laser treatment and mechanical separation, the posterior surface of the laser treated i… Show more

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