2023
DOI: 10.4028/p-4bjclj
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Atomic Force Microscopy Characterization of Polyacrylamide Substrate for Traction Force Application

Rosario L. Reserva,
Shusuke Ohura,
Daisuke Miyashiro
et al.

Abstract: Atomic Force Microscopy (AFM) technology has ushered researchers to directly observe surface topology and the substrate mechanical properties using specialized probe. AFM is one of the microscopic techniques with the highest lateral resolution which can be employed in air or even in liquids. In this experiment, we characterized the local elastic properties of the polyacrylamide (PA) hydrogel using Atomic Force Microscopy (AFM). PA consists of huge units of an organic acrylamide monomers which can be saturated … Show more

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