Atomic Force Microscopy Characterization of Carbon Nanotubes

Bellucci, Stefano; Gaggiotti, G; Marchetti, M.; Micciulla, F.; Mucciato, R; Regi, M.

doi:10.1088/1742-6596/61/1/021

Cited by 19 publications

(11 citation statements)

References 9 publications

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“…The morphology of the polymer film with carbon particles, the assessment of the size range of carbon particles under various conditions of their formation, as well as the compression deformation mapping were carried out using a scanning probe microscope Dimension FastScan by Bruker (Germany). [ 31,32 ] The morphology of the polymer film surface is shown in Figure 7.…”

Section: Characterization Results and Discussionmentioning

confidence: 99%

Single‐stage plasma‐chemical synthesis and characterization of carbon nanoparticle‐polymer suspensions

Данилаев

Богослов

Куклин

et al. 2020

Plasma Processes & Polymers

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A thin‐film styrene polymer–carbon nanoparticle composite was obtained in a single‐stage alternating current dielectric barrier discharge plasma‐chemical process. The allotropic forms of the carbon nanoparticle filler were traced by transmission electron microscopy (TEM). TEM revealed an extraordinary adhesive encapsulation of the carbon nanoparticles by the polymer. It was found that the corona discharge regime provides an onion‐like carbon filler that enhances the mechanical strength and chemical resistance of the synthesized polymer–carbon nanoparticle film. Measurements of the electrical properties of the films implicitly confirmed the uniformity of the carbon filler distribution.

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Section: Characterization Results and Discussionmentioning

confidence: 99%

Single‐stage plasma‐chemical synthesis and characterization of carbon nanoparticle‐polymer suspensions

Данилаев

Богослов

Куклин

et al. 2020

Plasma Processes & Polymers

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“…From Figure 3(a) and Figure 3(b), the most important features seen are the disorder induced D band at 1340 -1350 cm −1 and the tangential G band at 1550 -1580 cm −1 , which is related to the graphite tangential Raman active mode where the two atoms in graphene unit cell are vibrating tangentially one against the other. A presence in the Raman spectra of D bands with the frequency 1350 cm −1 is ascribed to a presence of amorphous Carbon in the sample, while the presence of G bands with a frequency 1580 cm −1 give us information about the existence of ordered Carbon structure [7]- [12].…”

Section: The Resultsmentioning

confidence: 99%

The Role of Sputtering Current on the Optical and Electrical Properties of Si-C Junction

Uonis

Mustafa²,

Ezzat³

2014

WJNSE

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The effect of sputtering current that flow in a carbon rod on the structural and transport properties of Si-C junction is studied. Si-C junction is fabricated by plasma sputtering in Argon gas atmosphere without catalysts with thickness of 20, 40 and 60 nm. Images of the specimen by scanning electron microscope (SEM) and atomic force microscope (AFM) show that the carbon layer is as carbon nanotubes with diameters about 20-30 nm. X-ray and Raman spectrums show peak characteristics of the carbon nanotubes, the G and D bands appear for all thicknesses indicating free of defect carbon nanotubes. Two parameters about the thickness of the carbon layer and the sputtering current for different thicknesses and currents were studied. Nanotubes evidence was clear. We noticed that the sputtering current and thickness of layers affect the structure of CNT layer leading to the formation of grains. Increasing plasma current led to decrease grain formation however increasing thickness ends to increase grain size; moreover it led to amorphous structure formation and this was proved through X-ray, Raman spectra and AFM images.

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“…Among these methods, atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are the most common SPMs applied in this field because they provide information about the elastic and electronic properties of small structures, respectively. AFM is a very high-resolution technique that is used in nanotube characterization at resolution lower than 1 nm [42]. Three-dimensional topographic AFM micrographs of CNTs have been obtained through the interaction between the AFM cantilever tip and the sample under investigation [43,44].…”

Section: Scanning Probe Microscopiesmentioning

confidence: 99%

Characterization of carbon nanotubes and analytical methods for their determination in environmental and biological samples: A review

Herrero-Latorre

Álvarez-Méndez

García

et al. 2015

Analytica Chimica Acta

113

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Atomic Force Microscopy Characterization of Carbon Nanotubes

Cited by 19 publications

References 9 publications

Single‐stage plasma‐chemical synthesis and characterization of carbon nanoparticle‐polymer suspensions

Single‐stage plasma‐chemical synthesis and characterization of carbon nanoparticle‐polymer suspensions

The Role of Sputtering Current on the Optical and Electrical Properties of Si-C Junction

Characterization of carbon nanotubes and analytical methods for their determination in environmental and biological samples: A review

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