Atomic Force Microscopy in Bioengineering Applications

Colaço, R.; Carvalho, P.A.

doi:10.1007/978-3-642-25414-7_15

Cited by 1 publication

(1 citation statement)

References 166 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…When the cantilever is scanning the surface, it is deflected due to interaction forces between the sample and the AFM tip. This deflection and the distance between the cantilever and the sample can be measured using a laser and a detector; a force–distance curve can also be derived to measure adhesion forces [ 24 , 25 , 26 ]. Kim et al [ 27 ] suggested a design methodology for the control of adhesion forces for nanostructures with the help of force–distance curve measurements using AFM.…”

Section: Introductionmentioning

confidence: 99%

Influence of Thin Film Deposition on AFM Cantilever Tips in Adhesion and Young’s Modulus of MEMS Surfaces

et al. 2022

View full text Add to dashboard Cite

Adhesion is a critical factor in microelectromechanical systems (MEMSs) and is influenced by many parameters. In important fields, such as microassembly, an improved understanding of adhesion can result in higher precision. This study examines the influence of deposition of gold and titanium onto the atomic force microscope (AFM) tips in adhesion forces and Young’s modulus, between a few MEMS substrates (silicon, gold, and silver) and the AFM tips. It was found that, except for gold substrate, an AFM tip coated with gold has the highest adhesion force of 42.67 nN for silicon substrates, whereas the titanium-coated AFM tip decreases the force for all the samples. This study suggests that such changes must be taken into account while studying the adhesion force. The final results indicate that utilizing gold substrate with titanium AFM tip led to the lowest adhesion force, which could be useful in adhesion force measurement during microassembly.

show abstract