2021
DOI: 10.1002/adem.202100634
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Atomic Force Microscopy Investigation of the In Situ‐Formed Oxide Layer at the Interface of Al2O3−C/Steel Melt in Terms of Adhesion Force and Roughness in a Model System

Abstract: The ORCID identification number(s) for the author(s) of this article can be found under https://doi.org/10.1002/adem.202100634.

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Cited by 3 publications
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“…External bias is known to induce film degradation; , however, there is no visible film damages present on the topographical images. As the RMS roughness of fresh perovskite films are in similar range of 7.4–13.6 nm (Table ), adhesion force of different perovskite types can be compared. , To evaluate the influence of the external reverse bias potential on the adhesion force as a whole, the average value was used for the comparison. The results indicate that the bias greatly impacts freshly-made samples rather than the 8-day old samples (Figure A,B).…”
Section: Resultsmentioning
confidence: 99%
“…External bias is known to induce film degradation; , however, there is no visible film damages present on the topographical images. As the RMS roughness of fresh perovskite films are in similar range of 7.4–13.6 nm (Table ), adhesion force of different perovskite types can be compared. , To evaluate the influence of the external reverse bias potential on the adhesion force as a whole, the average value was used for the comparison. The results indicate that the bias greatly impacts freshly-made samples rather than the 8-day old samples (Figure A,B).…”
Section: Resultsmentioning
confidence: 99%