Atomic Force Microscopy

Eaton, Peter; West, Paul

doi:10.1093/acprof:oso/9780199570454.001.0001

Cited by 448 publications

(359 citation statements)

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“…As many have reviewed these topics, the reader is referred to two recent books for more detailed information [15] and [21].…”

Section: A Brief History Of Atomic Force Microscopymentioning

confidence: 99%

“…When the measured force it larger or smaller than this set point, a voltage is applied to the z-piezo to move the probe away from or towards the surface, bringing the force back to the set point. Although these general concepts seem simple, their integration into a working system is complex and the reader is referred to another source for more details [15].…”

Section: Basic Afm Operationmentioning

confidence: 99%

“…Piezo actuators have a limited range in the z-direction, meaning that sample features typically must be less than 20 μm tall (or deep). In addition, since the probe is "feeling" the surface, there is the possibility that the shape of the probe is convoluted into the resulting image [15]. This problem is made worse as a tip is dulled or damaged with imaging.…”

Section: A Summary Of Afm's Strengths and Weaknessesmentioning

confidence: 99%

“…It is a high-resolution imaging modality which is less-destructive than either TEM or SEM. Samples imaged using AFM can remain intact and can be imaged in air or fluid, at room temperature or under culture conditions, implying that measured properties are characteristics of the sample and less likely artifacts of processing or imaging [14] and [15]. In addition, the AFM probe can be used to extract nanoscale mechanical properties (both in terms of the forces and physical size of material that is probed) by scratching, indenting, pushing or pulling on the sample.…”

Section: Introductionmentioning

confidence: 99%

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Applications of atomic force microscopy for the assessment of nanoscale morphological and mechanical properties of bone

Wallace¹

2012

Bone

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Scanning probe microscopy (SPM) has been in use for 30 years, and the form of SPM known as atomic force microscopy (AFM) has been around for 25 of those years. AFM has been used to produce high resolution images of a variety of samples ranging from DNA to carbon nanotubes.Type I collagen and many collagen-based tissues (including dentin, tendon, cartilage, skin, fascia, vocal cords, and cornea) have been studied with AFM, but comparatively few studies of bone have been undertaken. The purpose of this review is to introduce the general principles of AFM operation, demonstrate what AFM has been used for in bone research, and discuss the new directions that this technique can take the study of bone at the nanoscale.

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“…As many have reviewed these topics, the reader is referred to two recent books for more detailed information [15] and [21].…”

Section: A Brief History Of Atomic Force Microscopymentioning

confidence: 99%

Section: Basic Afm Operationmentioning

confidence: 99%

Section: A Summary Of Afm's Strengths and Weaknessesmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Applications of atomic force microscopy for the assessment of nanoscale morphological and mechanical properties of bone

Wallace¹

2012

Bone

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“…Scanning probe microscopy (SPM) such as atomic force microscopy (AFM) and near-field scanning optical microscopy (NSOM) is a commonly used and powerful imaging technique that offers nanometer resolution, but is limited to imaging the surface topology of a small area due to the serial scanning nature of a single tip [1,2]. Tip arrays have been pursued to increase the SPM throughput [3,4], but laborious engineering and control of individual tips are required to maintain the nanometer distance between each tip and surface.…”

Section: Introductionmentioning

confidence: 99%

Three-dimensional nanoscale imaging by plasmonic Brownian microscopy

et al. 2017

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Three-dimensional (3D) imaging at the nanoscale is a key to understanding of nanomaterials and complex systems. While scanning probe microscopy (SPM) has been the workhorse of nanoscale metrology, its slow scanning speed by a single probe tip can limit the application of SPM to wide-field imaging of 3D complex nanostructures. Both electron microscopy and optical tomography allow 3D imaging, but are limited to the use in vacuum environment due to electron scattering and to optical resolution in micron scales, respectively. Here we demonstrate plasmonic Brownian microscopy (PBM) as a way to improve the imaging speed of SPM. Unlike photonic force microscopy where a single trapped particle is used for a serial scanning, PBM utilizes a massive number of plasmonic nanoparticles (NPs) under Brownian diffusion in solution to scan in parallel around the unlabeled sample object. The motion of NPs under an evanescent field is three-dimensionally localized to reconstruct the superresolution topology of 3D dielectric objects. Our method allows high throughput imaging of complex 3D structures over a large field of view, even with internal structures such as cavities that cannot be accessed by conventional mechanical tips in SPM.

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Atomic Force Microscopy–AFM

Eaton

2011

Kirk-Othmer Encyclopedia of Chemical Technology

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Atomic force microscopy is a powerful, high‐resolution technique capable of recording topographic images of a wide variety of samples. Two key strengths of AFM are its ability to produce images in almost any environment—in air, vacuum, or solvent—and to measure a wide variety of physical properties of the sample. First, this article discusses how the atomic force microscope operates, beginning with a background and general principles and then describing all the major components of the atomic force microscope. Second, all the most commonly used modes of AFM are described, including contact and oscillating modes; lateral force microscopy; modes that measure mechanical properties, magnetic force microscopy, and electrical modes; and force spectroscopy and nanoindentation. Finally, several example applications are given with the focus on measurements with particular relevance to chemistry. These include electrochemical AFM, high‐resolution imaging, measurement of molecular interactions, AFM‐based nanolithography, and characterization of heterogeneity in polymeric systems.

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Atomic Force Microscopy

Cited by 448 publications

References 0 publications

Applications of atomic force microscopy for the assessment of nanoscale morphological and mechanical properties of bone

Applications of atomic force microscopy for the assessment of nanoscale morphological and mechanical properties of bone

Three-dimensional nanoscale imaging by plasmonic Brownian microscopy

Atomic Force Microscopy–AFM

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