2009
DOI: 10.1021/la803581k
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Atomic Layer Deposition of Aluminum Oxide on Carboxylic Acid-Terminated Self-Assembled Monolayers

Abstract: In situ infrared absorption spectroscopy is used to monitor atomic layer deposition (ALD) of aluminum oxide (Al2O3) on carboxylic acid-terminated self-assembled monolayers (SAMs), Si(111)-(CH2)10-COOH (or COOH-SAMs), directly grafted on silicon (111) at approximately 100 degrees C. The quality of resulting Al2O3 films is comparable to Al2O3 on SiO2. Both the SAM film and the Si/SAM interface remain chemically stable during growth and upon post annealing to 400 degrees C, suggesting that the tight packing of th… Show more

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Cited by 56 publications
(71 citation statements)
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“…Growth on the uCN terminated SAM, in contrast, appeared similar to growth on SiO 2 with no organic functionality. 79 In this case, it was shown that the SAM prevented oxidation of the underlying Si, which takes place if no SAM is present. 75 In a mixed layer of these same SAMs, it was found that the morphology of the subsequently deposited TiO 2 depended on the relative surface concentration of uOH versus uCH 3 terminations.…”
Section: Introductionmentioning
confidence: 93%
“…Growth on the uCN terminated SAM, in contrast, appeared similar to growth on SiO 2 with no organic functionality. 79 In this case, it was shown that the SAM prevented oxidation of the underlying Si, which takes place if no SAM is present. 75 In a mixed layer of these same SAMs, it was found that the morphology of the subsequently deposited TiO 2 depended on the relative surface concentration of uOH versus uCH 3 terminations.…”
Section: Introductionmentioning
confidence: 93%
“…171,172 ALD, a layer-by-layer growth technique, is gentle and selflimiting and does not affect the buried SAM/Si interface. 206 Importantly, the additional Al 2 O 3 layer significantly reduces the leakage current by almost 6 orders of magnitude. 171 The resulting CV behavior is restored, as shown in Figure 12b, with minimal frequency dispersion in the accumulation region.…”
Section: Capacitance−voltage and Conductance−voltage Measurementsmentioning
confidence: 99%
“…[1][2] The reactivity of hydrogen-terminated Si(111) (H-Si(111)) surfaces toward organic nucleophiles, including alkenes, [3][4] alkynes, [5][6] amines, [7][8][9][10][11] thiols and disulfides, [12][13] Grignards, [14][15] and alcohols, [16][17][18][19][20][21][22][23][24][25] has been widely exploited to impart desirable functionality to the Si interface. These surface reactions have been used to control the interface between Si and metals, [26][27][28][29][30][31] metal oxides, [32][33][34][35] polymers, [36][37][38][39][40][41] and redox assemblies.…”
Section: Introductionmentioning
confidence: 99%