2020
DOI: 10.1063/5.0009844
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Atomic layer deposition of SiO2–GeO2 multilayers

Abstract: Despite its potential for CMOS applications, atomic layer deposition (ALD) of GeO2 thin films, by itself or in combination with SiO2, has not been widely investigated yet. Here, we report the ALD growth of SiO2/GeO2 multilayers on si1icon substrates using a so far unexplored Ge precursor. The characterization of multilayers with various periodicities reveals layer-by-layer growth with electron density contrast and the absence of chemical intermixing, down to a periodicity of two atomic layers.

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Cited by 13 publications
(7 citation statements)
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“…GeO 2 nanosheets and films, even one atomic layer GeO 2 structure, have been synthesized in amorphous and crystalline 2D forms for many years. [297][298][299][300][301][302][303][304][305][306][307] However, GeO 2 materials do not include any vdW layered bulk materials; this is different from the common situation in which the 2D structures are usually simple monolayers of the bulk.…”
Section: Germanium Dichalcogenidesmentioning
confidence: 99%
“…GeO 2 nanosheets and films, even one atomic layer GeO 2 structure, have been synthesized in amorphous and crystalline 2D forms for many years. [297][298][299][300][301][302][303][304][305][306][307] However, GeO 2 materials do not include any vdW layered bulk materials; this is different from the common situation in which the 2D structures are usually simple monolayers of the bulk.…”
Section: Germanium Dichalcogenidesmentioning
confidence: 99%
“…Recently, using an evaporative-recirculation method, Balitsky et al 28 have succeeded to grow 4-12 mm thick quartz-like GeO 2 crystals on SiO 2 quartz substrates. Also recently, other works report insights into the crystallization mechanism of GeO 2 films 29 , as well as the possibility to obtain improved GeO 2 /SiO 2 miscibility by means of Atomic Layer Deposition multilayers 30 . To the best of our knowledge, crystalline thin films of the Si x Ge 1−x O 2 solid solution have not been reported.…”
Section: Introductionmentioning
confidence: 99%
“…Accordingly, it is necessary to seek a new ALD process with the ability to encapsulate the perovskite NCs without damaging the optical performance of the NCs. Recently, silica has been widely investigated and it is an ideal material to stabilize perovskite NCs against the external environment due to its excellent light transmission performance in the entire visible region and water corrosion resistance properties. , However, the thermal SiO 2 ALD process usually requires high temperatures (>300 °C), , which would induce PL quenching and agglomeration of the perovskite NCs . Therefore, it is important to develop a mild SiO 2 ALD method to encapsulate and stabilize the perovskite NCs.…”
Section: Introductionmentioning
confidence: 99%