2017
DOI: 10.1016/j.apsusc.2016.10.044
|View full text |Cite
|
Sign up to set email alerts
|

Atomic layer deposition of VO2 films with Tetrakis-dimethyl-amino vanadium (IV) as vanadium precursor

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

2
26
0

Year Published

2019
2019
2024
2024

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 31 publications
(28 citation statements)
references
References 35 publications
2
26
0
Order By: Relevance
“…A systematic coarsening of vanadium oxide was reported on fused silica substrates upon annealing in pure N 2 , [78]. When very similar films were annealed by Lv et al in inert ambient (pure Ar in their case), film cracking was observed, but no agglomeration was seen, indicating a better adhesion to the Si surface compared to the fused silica, [80]. The interplay between the presence of oxygen in the ambient and the nature of the substrate is not yet completely understood, and requires further research.…”
Section: Surface and Ambientmentioning
confidence: 79%
See 2 more Smart Citations
“…A systematic coarsening of vanadium oxide was reported on fused silica substrates upon annealing in pure N 2 , [78]. When very similar films were annealed by Lv et al in inert ambient (pure Ar in their case), film cracking was observed, but no agglomeration was seen, indicating a better adhesion to the Si surface compared to the fused silica, [80]. The interplay between the presence of oxygen in the ambient and the nature of the substrate is not yet completely understood, and requires further research.…”
Section: Surface and Ambientmentioning
confidence: 79%
“…Lv et al, [80], implemented the reaction of TDMAV with H 2 O in thermal ALD. The precursor was evaporated at 60 • C and carried into the reactor using Ar flow.…”
Section: Tetrakis Ethylmethyl Amino Vanadium (Temav)mentioning
confidence: 99%
See 1 more Smart Citation
“…[15][16][17][18][19][20] Using this precursor, the window of the deposition temperatures for VO2 has been reported to be between 125 and 175 o C. 15 The VO2 thin films were successfully deposited by ALD on various substrates, such as glass, SiO2, Al2O3 and GaN. 17,[21][22][23] The asdeposited ALD films are amorphous due to the low deposition temperature used, without a MIT, thus a post-deposition annealing is required. Many groups have reported the optimizations of the annealing conditions (temperature, time, ambient) and have shown that the annealing conditions are very important to achieve the desired VO2 phase.…”
Section: Introductionmentioning
confidence: 99%
“…Many groups have reported the optimizations of the annealing conditions (temperature, time, ambient) and have shown that the annealing conditions are very important to achieve the desired VO2 phase. 16,17,21 The This is the author's peer reviewed, accepted manuscript. However, the online version of record will be different from this version once it has been copyedited and typeset.…”
Section: Introductionmentioning
confidence: 99%