Atomic resolution imaging and frequency versus distance measurements on NiO(001) using low-temperature scanning force microscopy

Hoffmann, R.; Lantz, Mark A.; Hug, Hans J.; Schendel, P. J. A. van; Kappenberger, P.; Martin, S.; Baratoff, A.; Güntherodt, H.‐J.

doi:10.1103/physrevb.67.085402

Cited by 48 publications

(36 citation statements)

References 26 publications

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“…We believe that similar interaction mechanisms and tip models can be applied to model and understand nc-AFM imaging on other oxide surfaces. In particular, an FS study of the NiO surface has reported attractive forces with minima at 1.6 and at 2.3 nN, 18 very close to the values obtained here for the protrusion mode.…”

Section: Discussionsupporting

confidence: 61%

“…15 Force spectroscopy (FS) experiments, in which tip-sample forces are determined as a function of distance for specific surface sites 16 or over a two-dimensional (2D) area (3D mapping), 17 impose an even stronger constrain on the tip structure and the nature of the interactions. FS has been used to discriminate between the two ionic sublattices on several insulator surfaces, [18][19][20][21][22] to achieve single-atom chemical identification on semiconductors, 23 and to understand the nc-AFM contrast on carbon nanostructures. 24,25 In this work we combine site-specific force measurements and extensive first-principles calculations on TiO 2 (110)-1 × 1, aiming to clarify the origin of the observed nc-AFM contrast and to characterize the tip structures responsible for the protrusion and hole imaging modes.…”

Section: Introductionmentioning

confidence: 99%

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Understanding image contrast formation in TiO2with force spectroscopy

et al. 2012

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Site-specific force measurements on a rutile TiO 2 (110) surface are combined with first-principles calculations in order to clarify the origin of the force contrast and to characterize the tip structures responsible for the two most common imaging modes. Our force data, collected over a broad range of distances, are only consistent with a tip apex contaminated with clusters of surface material. A flexible model tip terminated with an oxygen explains the protrusion mode. For the hole mode we rule out previously proposed Ti-terminated tips, pointing instead to a chemically inert, OH-terminated apex. These two tips, just differing in the terminal H, provide a natural explanation for the frequent contrast changes found in the experiments. As tip-sample contact is difficult to avoid while imaging oxide surfaces, we expect our tip models to be relevant to interpret scanning probe studies of defects and adsorbates on TiO 2 and other technologically relevant metal oxides.

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Section: Discussionsupporting

confidence: 61%

Section: Introductionmentioning

confidence: 99%

Understanding image contrast formation in TiO2with force spectroscopy

et al. 2012

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“…4 When analyzing distance-dependent data, dynamic AFM can even provide chemical information on individual atoms at the surface, as has first been demonstrated in UHV: force−distance curves have been collected on Si(111)-(7 × 7), revealing site-specific differences and, thus, demonstrating the potential to differentiate inequivalent adatoms by a careful analysis of force−distance curves. 5 Later, ionic crystal sublattices have been identified on several crystals, including, for example, CaF 2 (111), 6 NiO(001), 7,8 NaCl(001), 9 and calcite (10.4). 10 A particularly challenging system has been studied by Sugimoto et al who have been the first to demonstrate the identification of individual surface atoms in an alloy of Pb, Sn, and Si, even though these atoms occupy identical surface positions and are not oppositely charged.…”

Section: ■ Introductionmentioning

confidence: 99%

Chemical Identification at the Solid–Liquid Interface

et al. 2016

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Solid−liquid interfaces are decisive for a wide range of natural and technological processes, including fields as diverse as geochemistry and environmental science as well as catalysis and corrosion protection. Dynamic atomic force microscopy nowadays provides unparalleled structural insights into solid−liquid interfaces, including the solvation structure above the surface. In contrast, chemical identification of individual interfacial atoms still remains a considerable challenge. So far, an identification of chemically alike atoms in a surface alloy has only been demonstrated under well-controlled ultrahigh vacuum conditions. In liquids, the recent advent of three-dimensional force mapping has opened the potential to discriminate between anionic and cationic surface species. However, a full chemical identification will also include the far more challenging situation of alike interfacial atoms (i.e., with the same net charge). Here we demonstrate the chemical identification capabilities of dynamic atomic force microscopy at solid−liquid interfaces by identifying Ca and Mg cations at the dolomite−water interface. Analyzing site-specific vertical positions of hydration layers and comparing them with molecular dynamics simulations unambiguously unravels the minute but decisive difference in ion hydration and provides a clear means for telling calcium and magnesium ions apart. Our work, thus, demonstrates the chemical identification capabilities of dynamic AFM at the solid−liquid interface.

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“…Achieving this proved to be particularly challenging on insulators. Although force curves have been measured selectively above different surface sites on binary insulators [1][2][3], the utility of these curves is questionable since the chemical identity of the tip apex and hence the surface sites has not been established. Overcoming the tip problem would therefore open an exciting opportunity for using noncontact atomic force microscopy (nc-AFM) for gaining new information regarding the interaction of individual tip features, such as dangling bonds and adsorbed molecules with regular and defect sites at insulating surfaces and interfaces.…”

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confidence: 99%

Interaction of Silicon Dangling Bonds with Insulating Surfaces

et al. 2004

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We use first principles density functional theory calculations to study the interaction of a model dangling bond silicon tip with the surfaces of CaF 2 , Al 2 O 3 , TiO 2 , and MgO. In each case the strongest interaction is with the highest anions in the surface. We show that this is due to the onset of chemical bonding with the surface anions, which can be controlled by an electric field across the system. Combining our results and previous studies on semiconductor surfaces suggests that using dangling bond Si tips can provide immediate identification of surface species in atomically resolved noncontact atomic force microscopy and facilitate selective measurements of short-range interactions with surface sites.

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Atomic resolution imaging and frequency versus distance measurements on NiO(001) using low-temperature scanning force microscopy

Cited by 48 publications

References 26 publications

Understanding image contrast formation in TiO2with force spectroscopy

Understanding image contrast formation in TiO2with force spectroscopy

Chemical Identification at the Solid–Liquid Interface

Interaction of Silicon Dangling Bonds with Insulating Surfaces

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