2011
DOI: 10.1002/adma.201004143
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Atomic‐Scale Evolution of Local Electronic Structure Across Multiferroic Domain Walls

Abstract: In complex, correlated oxides, heterointerfaces have emerged as key focal points of current condensed matter science. [1][2][3] For ferroic oxides, in order to minimize the total energy, domain walls emerge as natural interfaces. Multiferroic materials show a wealth of controllable multiple ferroic order through stress, optical excitation, electric, or magnetic fi elds in the same phase, which in turn suggest potential applications in the realization of oxide-based electronic devices, such as spintronics, info… Show more

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Cited by 95 publications
(71 citation statements)
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“…Figure 2c shows localized areas of enhanced conduction around both 71 o and 109 o domain walls in the as-grown (001)-BiFeO 3 films described above, as we have previously reported [18]. Similar results have been observed by Chiu et al [17] using scanning tunneling microscopy. However, in our films, unlike in those of ref.…”
Section: Methodssupporting
confidence: 88%
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“…Figure 2c shows localized areas of enhanced conduction around both 71 o and 109 o domain walls in the as-grown (001)-BiFeO 3 films described above, as we have previously reported [18]. Similar results have been observed by Chiu et al [17] using scanning tunneling microscopy. However, in our films, unlike in those of ref.…”
Section: Methodssupporting
confidence: 88%
“…However, in our films, unlike in those of ref. [17], the magnitude of the current in the 71 o walls is as large as that of the 109 o walls. This difference between the two studies could be due to the nature of the interfaces (out-of-plane twinning versus in-plane twinning) [32,34], which may invoke different conduction mechanisms, as mentioned in the previous section.…”
Section: Methodsmentioning
confidence: 90%
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“…The emergence of combined AFM and STM or SEM (scanning electron microscopy) and STM systems should be a boon in terms of exploring the electronic properties of domain walls in such insulating materials. Research using such combined tools is in its infancy (Wiessner et al, 1997;Yang et al, 2005;García, Huey, and Blendell, 2006;Chiu et al, 2011).…”
Section: B Scanning Probe Microscopymentioning
confidence: 99%