2016
DOI: 10.1103/physrevb.93.125412
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Atomic size effects studied by transport in single silicide nanowires

Abstract: Ultrathin metallic silicide nanowires with extremely high aspect ratios can be easily grown, e.g., by deposition of rare earth elements on semiconducting surfaces. These wires play a pivotal role in fundamental research and open intriguing perspectives for CMOS applications. However, the electronic properties of these one-dimensional systems are extremely sensitive to atomic-sized defects, which easily alter the transport characteristics. In this study, we characterized comprehensively TbSi 2 wires grown on Si… Show more

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Cited by 16 publications
(11 citation statements)
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“…The formation of nanowires, nanowire-like structures and islands are well-known for metal silicides grown on silicon surfaces. [54][55][56][57][58][59] But the formation of nanowire-like structures during the growth of REOs on Si(001) consisting of oxides was not reported so far.…”
Section: Discussionmentioning
confidence: 99%
“…The formation of nanowires, nanowire-like structures and islands are well-known for metal silicides grown on silicon surfaces. [54][55][56][57][58][59] But the formation of nanowire-like structures during the growth of REOs on Si(001) consisting of oxides was not reported so far.…”
Section: Discussionmentioning
confidence: 99%
“…Circles indicate two-coordinated atoms located at the boundaries of NW facets. [22][23][24][25][26][27][28][29]. Ning et al [30] used DFT calculation to systematical investigate the quantum confinement effect on the electronic properties of InAs NWs with different orientations, found that the band structures are dependent on the NW size and orientations.…”
Section: Introductionmentioning
confidence: 98%
“…В металлических пленках могут быть осцилляции зависимостей проводимости от толщины с периодом, равным половине длины волны де Бройля носителя заряда [1][2][3]. В полупроводниковых пленках наблюдается резкое увеличение сопротивления при малых толщинах [4][5][6]. Имеется значительное количество теоретических работ, в которых для решения задач об электропроводности тонких пленок и проволок использовался стандартный кинетический метод [7][8][9][10][11][12][13].…”
Section: Introductionunclassified