2017
DOI: 10.1016/j.hedp.2017.03.009
|View full text |Cite
|
Sign up to set email alerts
|

Atomic structure considerations for the low-temperature opacity of Sn

Abstract: We have begun a preliminary investigation into the opacity of Sn at low temperatures (< 50 eV). The emissivity and opacity of Sn is a crucial factor in determining the utility of Sn in EUV lithography, with numerous industrial implications. To this end, we have been exploring the accuracy of some approximations used in opacity models for the relevant ion stages of Sn (neutral through ∼ 18 times ionized). We find that the use of intermediate-coupling, as compared to full configuration-interaction, is not adequa… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

3
39
0
1

Year Published

2018
2018
2023
2023

Publication Types

Select...
7

Relationship

2
5

Authors

Journals

citations
Cited by 27 publications
(43 citation statements)
references
References 27 publications
3
39
0
1
Order By: Relevance
“…3 is the shift of the main emission feature from 15 nm toward the desired 13.5 nm with increasing laser intensity. This shift is related to the creation of tin ions of higher charge states (Sn 8+ to Sn 15+ ) relevant for in-band emission [1,4,6,12]. Additionally, the main emission feature narrows towards higher intensity, reaching a FWHM of 0.9 nm at 1.4 × 10 11 W/cm 2 .…”
Section: A Laser Intensitymentioning
confidence: 97%
See 2 more Smart Citations
“…3 is the shift of the main emission feature from 15 nm toward the desired 13.5 nm with increasing laser intensity. This shift is related to the creation of tin ions of higher charge states (Sn 8+ to Sn 15+ ) relevant for in-band emission [1,4,6,12]. Additionally, the main emission feature narrows towards higher intensity, reaching a FWHM of 0.9 nm at 1.4 × 10 11 W/cm 2 .…”
Section: A Laser Intensitymentioning
confidence: 97%
“…Highly charged tin ions in laser-produced transient plasmas are the atomic sources of EUV light at 13.5-nm wavelength for nanolithography [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15]. In state-of-the-art EUV sources such plasmas are produced by irradiation of micrometer-sized tin droplets with high-power CO 2 -gaslaser pulses [16][17][18] in a two-step process where first a laser prepulse [16][17][18][19][20][21][22][23] shapes the droplet into a target optimized for EUV production with a second, more energetic pulse.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…This shortwavelength radiation is used to imprint smaller features on commercial microchips. The aptness of Sn ions to this application stems from their open-4d-subshell structures [10][11][12][13][14][15][16][17][18][19][20] . Within these structures, Δn = 0 one-electron-excited configurations are very well documented in the literature to decay to the ground state manifold via a multitude of transitions clustered together in unresolved transition arrays (UTAs) 21 , centered in the industrially relevant band around 13.5 nm.…”
mentioning
confidence: 99%
“…Although such tables are not yet finalized, below we show various calculations and comparisons to experimental data, where available. We also note that we have embarked on some preliminary studies of the opacity of Sn at temperatures relevant to lithography applications [16], where the importance of accurate atomic structure to the resulting opacity is crucial.…”
Section: Resultsmentioning
confidence: 99%