The process of twinning formation during the growth of semiconductor thin films, particularly in CdTe homoepitaxial films, is a complex phenomenon that has eluded comprehensive understanding. Here, this study investigated the growth dynamics of CdTe homoepitaxial films on (111) Cd-and Te-terminated surfaces across a range of substrate temperatures. We employed molecular dynamics and time-stamped force-bias Monte Carlo simulations with a machine-learning force field to explore these growth dynamics. Our findings reveal that CdTe homoepitaxial layers are characterized by lamella twins with (111) twin boundaries parallel to the surface. The development of stacking fault layers is potentially influenced by the presence of residual holes prior to the crystallization of subsequent layers. We also observed that (111) Te homoepitaxial layers exhibit more significant planar defects than (111) Cd homoepitaxial layers, and this disparity is more pronounced at lower substrate temperatures and can be attributed to the more reactive (111) Te-terminated surface. Moreover, there is a notable trend in which the prevalence of planar defects escalates with increasing substrate temperature, arising from the competing formation mechanism of CdTe zinc-blende and wurtzite structures. This work offers detailed atomiclevel insights into the growth and twinning mechanisms of CdTe homoepitaxial films.