Atomic structures of planar defects in 0.95(Na0.5Bi0.5)TiO3–0.05BaTiO3 lead-free piezoelectric thin films

Mi, Shao‐Bo; Jin, Xiaowei; Cheng, Sheng; Liu, Ming; Lu, Lu; Jia, Chun-Lin

doi:10.1016/j.jallcom.2015.02.158

Cited by 7 publications

(3 citation statements)

References 15 publications

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“…3(a)), while it has a square pattern along the <110> direction (see supplementary Figure S2). The spacing between the layers was measured to be ~0.26 nm, which is consistent with that of Aurivillius-type layers formed in 0.95(Na 0.5 Bi 0.5 )TiO 3 −0.05BaTiO 3 thin films26.…”

Section: Resultssupporting

confidence: 78%

Surface reconstructions and related local properties of a BiFeO3 thin film

Jin

Zeng

et al. 2017

Sci Rep

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Coupling between lattice and order parameters, such as polarization in ferroelectrics and/or polarity in polar structures, has a strong impact on surface relaxation and reconstruction. However, up to now, surface structures that involve the termination of both matrix polarization and polar atomic planes have received little attention, particularly on the atomic scale. Here, we study surface structures on a BiFeO3 thin film using atomic-resolution scanning transmission electron microscopy and spectroscopy. Two types of surface structure are found, depending on the polarization of the underlying ferroelectric domain. On domains that have an upward polarization component, a layer with an Aurivillius-Bi2O2-like structural unit is observed. Dramatic changes in local properties are measured directly below the surface layer. On domains that have a downward polarization component, no reconstructions are visible. Calculations based on ab initio density functional theory reproduce the results and are used to interpret the formation of the surface structures.

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Section: Resultssupporting

confidence: 78%

Surface reconstructions and related local properties of a BiFeO3 thin film

Jin

Zeng

et al. 2017

Sci Rep

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“…Humps could be the signature of planar defects such as those observed in BNBT5 [130] or be assigned to a near surface layer considered for relaxor ferroelectrics to accommodate the lattice distortion near the surface [131,132,133]. …”

Section: Case Study: the Bnbt Systemmentioning

confidence: 99%

Ferroelectrics under the Synchrotron Light: A Review

et al. 2015

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Currently, an intensive search for high-performance lead-free ferroelectric materials is taking place. ABO3 perovskites (A = Ba, Bi, Ca, K and Na; B = Fe, Nb, Ti, and Zr) appear as promising candidates. Understanding the structure–function relationship is mandatory, and, in this field, the roles of long- and short-range crystal orders and interactions are decisive. In this review, recent advances in the global and local characterization of ferroelectric materials by synchrotron light diffraction, scattering and absorption are analyzed. Single- and poly-crystal synchrotron diffraction studies allow high-resolution investigations regarding the long-range average position of ions and subtle global symmetry break-downs. Ferroelectric materials, under the action of electric fields, undergo crystal symmetry, crystallite/domain orientation distribution and strain condition transformations. Methodological aspects of monitoring these processes are discussed. Two-dimensional diffraction clarify larger scale ordering: polycrystal texture is measured from the intensities distribution along the Debye rings. Local order is investigated by diffuse scattering (DS) and X-ray absorption fine structure (XAFS) experiments. DS provides information about thermal, chemical and displacive low-dimensional disorders. XAFS investigation of ferroelectrics reveals local B-cation off-centering and oxidation state. This technique has the advantage of being element-selective. Representative reports of the mentioned studies are described.

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“…3b,c, respectively, recorded in the same region simultaneously and viewed along the [100] PBMO zone axis. Under the HAADF-and ABF-STEM imaging conditions, different atomic columns including cations and oxygen can be identified at the interface 24,31 . The interfacial CeO 2 layer is indicated by a vertical yellow arrow and the terminated layer of the PMBO film is indicated by a vertical red arrow.…”

Section: Resultsmentioning

confidence: 99%

Self-assembling behavior and interface structure in vertically aligned nanocomposite (Pr0.5Ba0.5MnO3)1-x:(CeO2)x films on (001) (La,Sr)(Al,Ta)O3 substrates

Cheng

Shen

et al. 2020

Sci Rep

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Heteroepitaxial oxide-based nanocomposite films possessing a variety of functional properties have attracted tremendous research interest. Here, self-assembled vertically aligned nanocomposite (Pr0.5Ba0.5MnO3)1-x:(CeO2)x (x = 0.2 and 0.5) films have been successfully grown on single-crystalline (001) (La,Sr)(Al,Ta)O3 substrates by the pulsed laser deposition technique. Self-assembling behavior of the nanocomposite films and atomic-scale interface structure between Pr0.5Ba0.5MnO3 matrix and CeO2 nanopillars have been investigated by advanced electron microscopy techniques. Two different orientation relationships, (001)[100]Pr0.5Ba0.5MnO3//(001)[1-10]CeO2 and (001)[100]Pr0.5Ba0.5MnO3//(110)[1-10]CeO2, form between Pr0.5Ba0.5MnO3 and CeO2 in the (Pr0.5Ba0.5MnO3)0.8:(CeO2)0.2 film along the film growth direction, which is essentially different from vertically aligned nanocomposite (Pr0.5Ba0.5MnO3)0.5:(CeO2)0.5 films having only (001)[100]Pr0.5Ba0.5MnO3//(001)[1-10]CeO2 orientation relationship. Both coherent and semi-coherent Pr0.5Ba0.5MnO3/CeO2 interface appear in the films. In contrast to semi-coherent interface with regular distribution of interfacial dislocations, interface reconstruction occurs at the coherent Pr0.5Ba0.5MnO3/CeO2 interface. Our findings indicate that epitaxial strain imposed by the concentration of CeO2 in the nanocomposite films affects the self-assembling behavior of the vertically aligned nanocomposite (Pr0.5Ba0.5MnO3)1-x:(CeO2)x films.

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Atomic structures of planar defects in 0.95(Na0.5Bi0.5)TiO3–0.05BaTiO3 lead-free piezoelectric thin films

Cited by 7 publications

References 15 publications

Surface reconstructions and related local properties of a BiFeO3 thin film

Surface reconstructions and related local properties of a BiFeO3 thin film

Ferroelectrics under the Synchrotron Light: A Review

Self-assembling behavior and interface structure in vertically aligned nanocomposite (Pr0.5Ba0.5MnO3)1-x:(CeO2)x films on (001) (La,Sr)(Al,Ta)O3 substrates

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