1999
DOI: 10.1016/s0304-8853(98)01199-8
|View full text |Cite
|
Sign up to set email alerts
|

Atomically resolved p(3×1) reconstruction on the W(100) surface imaged with magnetic tips

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
5
0

Year Published

2003
2003
2015
2015

Publication Types

Select...
5
1
1

Relationship

0
7

Authors

Journals

citations
Cited by 11 publications
(5 citation statements)
references
References 6 publications
0
5
0
Order By: Relevance
“…T ips made of bulk antiferromagnetic materials such as chromium [1][2][3] have been proposed for spin-polarized scanning tunneling microscopy (SP-STM [4][5][6] ) and have recently been shown to provide magnetic contrast on Cr(001) and Fe/W(110). 7,8) As compared with W tips covered with an ultrathin film of antiferromagnetic material, 6,9,10) they present the advantage of a simpler preparation which does not require a dedicated tip preparation stage.…”
mentioning
confidence: 99%
“…T ips made of bulk antiferromagnetic materials such as chromium [1][2][3] have been proposed for spin-polarized scanning tunneling microscopy (SP-STM [4][5][6] ) and have recently been shown to provide magnetic contrast on Cr(001) and Fe/W(110). 7,8) As compared with W tips covered with an ultrathin film of antiferromagnetic material, 6,9,10) they present the advantage of a simpler preparation which does not require a dedicated tip preparation stage.…”
mentioning
confidence: 99%
“…For example, in Spin Polarized STM (SP-STM) measurements, ferromagnetic or anti-ferromagnetic tips exhibiting an intrinsic spin polarization have to be used. Usual ferromagnetic tips are made of Fe [2], Ni [3], Co [4] or Fe coated W tips [5], while anti-ferromagnetic tips have been prepared using MnNi [6], MnPt [7], Cr [8,9,10], Cr-coated [11] or Mn-coated [12] W tips . Anti-ferromagnetic materials are usually preferred because they do not exhibit significant perturbing stray field and are not influenced by external fields.…”
mentioning
confidence: 99%
“…The tips were rinsed with distilled water and inserted into the UHV system where they were cleaned with 1 keV Ar ϩ ions prior to use. This technique improves upon earlier preparation procedures developed in our laboratory, 13,14 to produce tips with a lower aspect ratio and with tip apexes lying in the 50-100 nm range. SEM images of a MnNi tip prepared in this fashion are shown in Fig.…”
Section: Resultsmentioning
confidence: 97%