2023
DOI: 10.1021/acsami.2c22590
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Atomically Thin Metal–Dielectric Heterostructures by Atomic Layer Deposition

Abstract: Heterostructures increasingly attracted attention over the past several years to enable various optoelectronic and photonic applications. In this work, atomically thin interfaces of Ir/Al2O3 heterostructures compatible with micro-optoelectronic technologies are reported. Their structural and optical properties were determined by spectroscopic and microscopic techniques (XRR, XPS, HRTEM, spectroscopic ellipsometry, and UV/vis/NIR spectrophotometry). The XRR and HRTEM analyses reveal a layer-by-layer growth mech… Show more

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Cited by 4 publications
(4 citation statements)
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“…The relevant findings for this work are that the Ir percolates rather fast and forms homogeneous layers rather than nanoparticles. The presence of a Bragg peak in the X-ray reflectivity measurements evidenced the continuous metallic layers in the samples [22]. After the deposition of a pair of gold electrodes a µm-sized gap is formed.…”
Section: Methodsmentioning
confidence: 95%
See 2 more Smart Citations
“…The relevant findings for this work are that the Ir percolates rather fast and forms homogeneous layers rather than nanoparticles. The presence of a Bragg peak in the X-ray reflectivity measurements evidenced the continuous metallic layers in the samples [22]. After the deposition of a pair of gold electrodes a µm-sized gap is formed.…”
Section: Methodsmentioning
confidence: 95%
“…In this work the number of cycles for the Al 2 O 3 is fixed to 35, while the number of cycles of Ir is # = {0, 8, 16, 32, 64}, which leads to f = {0 %, 11 %, 21 %, 34 %, 51 %} fractional content respectively. The detailed investigation of the sample properties was carried out elsewhere [22]. The relevant findings for this work are that the Ir percolates rather fast and forms homogeneous layers rather than nanoparticles.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…We implemented tapered electrodes, see Fig. 1a, b , on a thin metal−dielectric heterostructure of Ir and Al 2 O 3 made by atomic-layer deposition (ALD) on a fused silica substrate 42 . The heterostructure has a nanolaminate structure and possesses a high χ (3) that enhances the magnitude of CEP-sensitive currents, as already indicated in refs.…”
Section: Introductionmentioning
confidence: 99%