2020
DOI: 10.1021/acs.nanolett.0c01222
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Atomistic Positioning of Defects in Helium Ion Treated Single-Layer MoS2

Abstract: Structuring materials with atomic precision is the ultimate goal of nanotechnology and is becoming increasingly relevant as an enabling technology for quantum electronics/spintronics and quantum photonics. Here, we create atomic defects in monolayer MoS2 by helium ion (He-ion) beam lithography with a spatial fidelity approaching the single-atom limit in all three dimensions. Using low-temperature scanning tunneling microscopy (STM), we confirm the formation of individual point defects in MoS2 upon He-ion bomba… Show more

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Cited by 68 publications
(83 citation statements)
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“…In agreement with our optical studies, the surface of MoS 2 is virtually free from adsorbates after mild annealing. By far the most dominant defects in pristine material were oxygen atoms substituting sulfur, but no sulfur vacancies were observed (Supplementary Information S5) 9,19,20 .…”
Section: Resultsmentioning
confidence: 99%
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“…In agreement with our optical studies, the surface of MoS 2 is virtually free from adsorbates after mild annealing. By far the most dominant defects in pristine material were oxygen atoms substituting sulfur, but no sulfur vacancies were observed (Supplementary Information S5) 9,19,20 .…”
Section: Resultsmentioning
confidence: 99%
“…3f). For He-ion treated samples, sulfur vacancies are the dominant defect type, among other defects that are generated with lower yield 9 . Furthermore, we performed CO-tip AFM on the sulfur vacancies (Figure 3g and Fig.…”
Section: Resultsmentioning
confidence: 99%
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