Attachment of electrons to molecules at submillielectronvolt resolution

Klar, D.; Ruf, M.-W.; Hotop, H.

doi:10.1016/0009-2614(92)85230-8

Cited by 94 publications

(91 citation statements)

References 24 publications

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“…Lowenergy DEA to homonuclear halogen molecules, like F 2 and Cl 2 , is dominated by the u resonance with the p wave as a main component [1,2]. This leads, according to the Wigner threshold law for exothermic reactions [3], to E 1/2 behavior of the cross section as a function of electron energy E at low values of E. Confirmation of this prediction became possible after development of laser electron attachment method [4] generating very highly resolved in energy electron beams. The Wigner threshold law was observed for Cl 2 [5,6] and F 2 [7].…”

Section: Introductionmentioning

confidence: 87%

Dissociative electron attachment to halogen molecules: Angular distributions and nonlocal effects

Fabrikant

2016

Phys. Rev. A

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Section: Introductionmentioning

confidence: 87%

Dissociative electron attachment to halogen molecules: Angular distributions and nonlocal effects

Fabrikant

2016

Phys. Rev. A

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“…This leads to the reduced energy scale i = 1.80͓͑E − E 0i ͒ / eV͔ 1/2 . Suggesting 15 that both the experimental nondissociative attachment cross sections [24][25][26] and the thermal detachment rate constants 15,27,28 for SF 6 − are not only determined by pure electron capture but also include contributions from IVR, we then modify P͑ i ͒ by an additional, empirical, factor P IVR ͑ i ͒. In Ref.…”

Section: Detachment Rates and Electron Energy Distributions Frommentioning

confidence: 99%

On the accuracy of thermionic electron emission models. I. Electron detachment from SF6−

Troe

Miller

Viggiano

2009

The Journal of Chemical Physics

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Detailed statistical rate calculations combined with electron capture theory and kinetic modeling for the electron attachment to SF 6 and detachment from SF 6 − ͓Troe et al., J. Chem. Phys. 127, 244303 ͑2007͔͒ are used to test thermionic electron emission models. A new method to calculate the specific detachment rate constants k det ͑E͒ and the electron energy distributions f͑E , ͒ as functions of the total energy E of the anion and the energy of the emitted electrons is presented, which is computationally simple but neglects fine structures in the detailed k det ͑E͒. Reduced electron energy distributions f͑E , / ͗͒͘ were found to be of the form ͑ / ͗͒͘ n exp͑− / ͗͒͘ with n Ϸ 0.15, whose shape corresponds to thermal distributions only to a limited extent. In contrast, the average energies ͗͑E͒͘ can be roughly estimated within thermionic emission and finite heat bath concepts. An effective temperature T d ͑E͒ is determined from the relation E −EA=͗E SF 6 ͑T d ͒͘ + kT d , where ͗E SF 6 ͑T d ͒͘ denotes the thermal internal energy of the detachment product SF 6 at the temperature T d and EA is the electron affinity of SF 6 . The average electron energy is then approximately given by ͗͑E͒͘ = kT d ͑E͒, but dynamical details of the process are not accounted for by this approach. Simplified representations of k det ͑E͒ in terms of T d ͑E͒ from the literature are shown to lead to only semiquantitative agreement with the equally simple but more accurate calculations presented here. An effective "isokinetic" electron emission temperature T e ͑E͒ does not appear to be useful for the electron detachment system considered because it neither provides advantages over a representation of k det ͑E͒ as a function of T d ͑E͒, nor are recommended relations between T e ͑E͒ and T d ͑E͒ of sufficient accuracy.

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“…With commercially available detectors with a temporal resolution better than 100 ps, 15 magnetic shielding that is proven to work with 200 meV electrons, 10 and a drift tube of 5 cm, Eq. ͑4͒ predicts an energy resolution of 0.2 meV.…”

Section: ͑3͒mentioning

confidence: 99%

“…Such methods have provided 0.2 meV resolution for 0 -200 meV electrons. 10 Such resolutions are reached with measuring times of about a day. 11 Data acquisition times for TOF systems are potentially shorter than those of scanning energy analyzers, because all energies are acquired simultaneously.…”

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confidence: 98%

A high repetition rate time-of-flight electron energy analyzer

Hilbert

Barwick

Fabrikant

et al. 2007

Applied Physics Letters

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We demonstrate a time-of-flight electron energy analyzer that operates at an 80MHz repetition rate. The analyzer yields an energy resolution of 40meV for 3eV electrons. The energy resolution limit is dominated by the detector time (or temporal) resolution. With a currently available detector with a temporal resolution of 100ps, we predict an energy resolution of less than 1meV for 200meV electrons. This makes high repetition rate time-of-flight energy analyzers a promising low-technology alternative to current state-of-the-art techniques.

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Attachment of electrons to molecules at submillielectronvolt resolution

Cited by 94 publications

References 24 publications

Dissociative electron attachment to halogen molecules: Angular distributions and nonlocal effects

Dissociative electron attachment to halogen molecules: Angular distributions and nonlocal effects

On the accuracy of thermionic electron emission models. I. Electron detachment from SF6−

A high repetition rate time-of-flight electron energy analyzer

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