2010
DOI: 10.1088/1742-6596/223/1/012040
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Auger-electron spectroscopy investigation of thin Ag-As-S-Se films

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Cited by 1 publication
(2 citation statements)
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“…The Raman spectra of the photodoped thin Ag/As 40 S 60−x Se x films at the thickness ratio of Ag layer/chalgonide film 1:10 indicate that silver atoms have probably been incorporated in the glassy network in the form of AgAsS(Se) 2 structural units after exposure with white light [19]. The Auger-electron spectroscopy profiles investigation of Ag photo-doped film with composition As 32 S 34 Se 34 supports the assumption that silver has been uniformly distributed in the chalcogenide films [20].…”
Section: Introductionmentioning
confidence: 53%
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“…The Raman spectra of the photodoped thin Ag/As 40 S 60−x Se x films at the thickness ratio of Ag layer/chalgonide film 1:10 indicate that silver atoms have probably been incorporated in the glassy network in the form of AgAsS(Se) 2 structural units after exposure with white light [19]. The Auger-electron spectroscopy profiles investigation of Ag photo-doped film with composition As 32 S 34 Se 34 supports the assumption that silver has been uniformly distributed in the chalcogenide films [20].…”
Section: Introductionmentioning
confidence: 53%
“…The films were exposed to white (mercury lamp 20 mW cm −2 ) or monochromatic light at λ = 488, 514 nm (Ar + laser 100 mW cm −2 ) and 632.8 nm (He-Ne laser-40 mW cm −2 ). Following the deposition process, the double-layered structure, chalcogenide/silver, was illuminated with Hg lamp in portions through the chalcogenide side until a homogeneous Ag-doped layer was obtained [19,20]. The samples were exposed in air.…”
Section: Methodsmentioning
confidence: 99%