“…Peaks representing the lattice planes are observed depending on the distribution, crystallinity and alignment of the crystals. A number of mathematical functions can be used to fit the experimental diffracted intensity profile near the peaks, such as Gaussian, Lorentzian, Voigt, Pseudo-Voigt, Pearson, Rietveld refinement, etc [41,42,53,54]. These functions work well for the perfect and pure crystalline structures, where the diffraction peaks are sharp and distinct.…”