Structural and Residual Stress Analysis by Nondestructive Methods 1997
DOI: 10.1016/b978-044482476-9/50000-1
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Cited by 124 publications
(199 citation statements)
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“…Peaks representing the lattice planes are observed depending on the distribution, crystallinity and alignment of the crystals. A number of mathematical functions can be used to fit the experimental diffracted intensity profile near the peaks, such as Gaussian, Lorentzian, Voigt, Pseudo-Voigt, Pearson, Rietveld refinement, etc [41,42,53,54]. These functions work well for the perfect and pure crystalline structures, where the diffraction peaks are sharp and distinct.…”
Section: X-ray Diffractionmentioning
confidence: 99%
See 1 more Smart Citation
“…Peaks representing the lattice planes are observed depending on the distribution, crystallinity and alignment of the crystals. A number of mathematical functions can be used to fit the experimental diffracted intensity profile near the peaks, such as Gaussian, Lorentzian, Voigt, Pseudo-Voigt, Pearson, Rietveld refinement, etc [41,42,53,54]. These functions work well for the perfect and pure crystalline structures, where the diffraction peaks are sharp and distinct.…”
Section: X-ray Diffractionmentioning
confidence: 99%
“…In general, during the measurement of surface strains, plane stress conditions are assumed to exist, and only two principal stresses lying within the plane of the surface are used, neglecting the stress normal to the surface. Hence, from the theory of elasticity, the basic [53,54]:…”
Section: Residual Stress-strain Measurementmentioning
confidence: 99%
“…2-5 However, these alloys can exhibit rolling and crystallization textures which, generally, make it difficult to use the technique. 6 In such a situation, the possible reflection directions are restricted to small angular ranges near the intensity poles of the texture and the influences of elastic anisotropy and grain interactions on the X-ray strain measurements may have to be taken into account.…”
Section: Doi: 101177/0014485105051007mentioning
confidence: 99%
“…If stress gradients are steep enough over the range of depth penetration of X-rays, the sin 2 plots exhibit curvature. Such curvature can be used to estimate the variation of the stress components with depth [3]. However, this method has difficulties with the lack of sensitivity to stress gradients and the fact that several combinations of gradients may cause the same curvature.…”
Section: Introductionmentioning
confidence: 99%