Automated comparator for accurate AC-DC difference measurements at the BNM-LCIE

Polétaeff, A.

doi:10.1109/19.769613

Cited by 10 publications

(6 citation statements)

References 2 publications

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“…2, large disagreement in ac-dc transfer differences at the unit under test (UUT) position and at the reference position was observed. The large difference is probably caused by the stray capacitance between the heater and the thermocouples [8], [9]. Figure 3 shows the ac-dc transfer differences for a thin film MJTC fabricated with the present study.…”

Section: Designmentioning

confidence: 87%

High-Performance Thin-Film Multijunction Thermal Converter Developed at AIST

Fujiki¹,

Kasai²,

Sasaki³

et al. 2004

2004 Conference on Precision Electromagnetic Measurements

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For wide spread distribution of multijunction thermal converters (MJTCs), thin film MJTCs with a novel structure have been developed. In order to reduce the effect of thermal ripples to the output voltage for MJTCs, we introduced an AIN chip under a Cu electrode on which Bi/Sb thermocouples are integrated. The thermoelectric transfer difference of the new MJTCs was evaluated to be less than 0.2 pVN and their ac-dc differences was measured to be less than 10 pV/V in the frequency range from 10 Hz up to 1 MHz. The maximum output EMF for developed MJTCs was 35 mV.

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Section: Designmentioning

confidence: 87%

High-Performance Thin-Film Multijunction Thermal Converter Developed at AIST

Fujiki¹,

Kasai²,

Sasaki³

et al. 2004

2004 Conference on Precision Electromagnetic Measurements

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“…Fig. 5 shows the features of the measurement method with the use of the bridge scheme on the example of the system of the automatic comparison implemented at LNE [24].…”

Section: Fig 4 2-channel Measurement Methodsmentioning

confidence: 99%

A comparative analysis of AC/DC transfer standards for comparison of national standards

Velychko¹,

Isaiev²

2018

EEJET

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“…• Calibration of the voltage injection system (UR2): this device is calibrated prior to each calibration series, by verifying the voltage levels and phases (0 • and 180 • for generators used for the in-phase component, 90 • and 270 • for those used for the quadrature component) of the EMX-1434 modules. These PXI modules are calibrated using an automated comparator based on AC-DC Transfer Standards [37,38]. The calibration frequencies are: 100 Hz, 1 kHz, 5 kHz, 10 kHz and 20 kHz.…”

Section: Uncertainty Budgetmentioning

confidence: 99%

“…• Calibration of the supply source (UR3): the DualDAC TM power source is also calibrated before each calibration series, by verifying the voltage levels and phases (180 • between the two generators of the source). Similarly to the PXI modules, the DualDAC TM source has been calibrated using an automated comparator based on AC-DC Transfer Standards [37,38]. The uncertainties are less than ±1.6 μV (k = 1) up to 20 kHz.…”

Section: Uncertainty Budgetmentioning

confidence: 99%

New impedance bridge at LNE for the two terminal-pair AC resistor calibration up to 20 kHz

Ouameur¹,

Vasconcellos²,

Agazar³

et al. 2022

Metrologia

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This paper presents the evolution of LNE’s impedance bridge (Wheatstone bridge) used to calibrate AC resistors defined in the two terminal-pair (2TP) configuration. A new automated Wheatstone bridge, based on 4 resistances, was developed to operate in the full complex plane for resistances ranging from 400 Ω to 2 MΩ and for frequencies up to 20 kHz. A commercial dual precision arbitrary waveform generator supplies the bridge and PXI modules achieve the balance. A phase and frequency synchronization solutions between the arbitrary waveform generator source and the PXI modules were used. The choice of these instruments allows the bridge to be easily automated and to benefit from recent progress in the development of digital analog converters, in particular those with high frequency sampling rates and resolution. The bridge is mainly dedicated to realize the periodic calibration of LNE’s standard resistors, used for routine customer calibrations. The traceability of LNE’s standard resistors is ensured, firstly, by the calibration of a 1 kΩ resistor by comparison to a calculable resistor up to 20 kHz. Then, this resistor is used as a reference element to ensure the traceability of all LNE’s standard resistors using the new bridge. The validation was done by comparing the results obtained, for some resistors with very low drift, with those obtained during calibrations performed in 1983, 1995 and 2009. For resistors of 1 kΩ in a 1:1 ratio, the expanded uncertainty of series resistance variation and argument are, respectively, less than 1.3 µΩ/Ω (k = 1) and 1.2 µrad (k = 1), up to 20 kHz.

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Automated comparator for accurate AC-DC difference measurements at the BNM-LCIE

Cited by 10 publications

References 2 publications

High-Performance Thin-Film Multijunction Thermal Converter Developed at AIST

High-Performance Thin-Film Multijunction Thermal Converter Developed at AIST

A comparative analysis of AC/DC transfer standards for comparison of national standards

New impedance bridge at LNE for the two terminal-pair AC resistor calibration up to 20 kHz

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