2022
DOI: 10.1109/jphotov.2021.3131059
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Automated Defect Detection and Localization in Photovoltaic Cells Using Semantic Segmentation of Electroluminescence Images

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Cited by 39 publications
(4 citation statements)
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“…Various researchers in the literature have deployed several material characterization techniques such as SEM, EDS, and top-down high-resolution X-ray photoelectron spectroscopy (XPS) analytical processes and imaging techniques on cored samples to analyze corrosion [40,[76][77][78][79]. In [78,80], the authors used EL imaging as characterization method to analyze degradation signatures including corrosions in both multicrystalline and monocrystalline silicon cells. The authors in [78] used ac impedance spectroscopy to analyze degradation in crystalline silicon modules that are exposed to HAc vapor.…”
Section: Corrosionmentioning
confidence: 99%
“…Various researchers in the literature have deployed several material characterization techniques such as SEM, EDS, and top-down high-resolution X-ray photoelectron spectroscopy (XPS) analytical processes and imaging techniques on cored samples to analyze corrosion [40,[76][77][78][79]. In [78,80], the authors used EL imaging as characterization method to analyze degradation signatures including corrosions in both multicrystalline and monocrystalline silicon cells. The authors in [78] used ac impedance spectroscopy to analyze degradation in crystalline silicon modules that are exposed to HAc vapor.…”
Section: Corrosionmentioning
confidence: 99%
“…There are three main steps: spraying an epoxy coating mixed with ZnS, depositing a Cu electroluminescent powder on the insulator surface, obtaining photoluminescence images under different voltages, and determining the electric field distribution via the proposed image processing algorithm. Fioresi et al [11] proposed a deep learning-based semantic segmentation model that identifies and segments defects in EL images of silicon PV cells, which utilizes a segmentation Deeplabv3 model with a ResNet50 backbone.…”
Section: Introductionmentioning
confidence: 99%
“…In silicon wafer and solar cell fields, many studies have investigated micro-crack defect detection methods, which can be generally divided into the following categories according to their respective technical principles [3,4]: light beam induced current [5], lock-in thermography [6], resonance ultrasonic vibration [7], scanning acoustic microscopy [8], optical transmission [9], photoluminescence (PL) [10], and electroluminescence (EL) [11]. However, these methods are primarily used to detect micro-crack defects on the surface or internal structure of silicon wafers and solar cells.…”
Section: Introductionmentioning
confidence: 99%