2001
DOI: 10.1016/s0039-6028(01)01487-x
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Automated detection of particles, clusters and islands in scanning probe microscopy images

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Cited by 26 publications
(24 citation statements)
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“…Each distribution can be fitted very well with the modified Bessel function, confirming the vacancymediated diffusion mechanism for the indium atoms. Discrepancies between the expected and measured probabilities for jumps of unit length are an artifact of the automated procedure that was used to analyse the images [29]. 3 For comparison, one of the panels contains the best-fit Gaussian curve that should be followed for ordinary, i.e.…”
Section: Jump Length Distributionmentioning
confidence: 99%
See 1 more Smart Citation
“…Each distribution can be fitted very well with the modified Bessel function, confirming the vacancymediated diffusion mechanism for the indium atoms. Discrepancies between the expected and measured probabilities for jumps of unit length are an artifact of the automated procedure that was used to analyse the images [29]. 3 For comparison, one of the panels contains the best-fit Gaussian curve that should be followed for ordinary, i.e.…”
Section: Jump Length Distributionmentioning
confidence: 99%
“…The time constant s is shown in the graph for each of the distributions. Too high or too low count rates at short waiting times are an artifact of the automated analysis scheme of the images [29] (refer footnote 3) and are ignored in the fits. species has to overcome to hop from one potential well to the next.…”
Section: Temperature Dependence Of the Jump Frequencymentioning
confidence: 99%
“…To create a background to subtract from the original image, we use the method of Jak et al [50]. This method was originally used by Jak et al [50] to count objects in STM images, but it can also be applied to STEM and SEM images where the objects of interest are brighter and much smaller than the background features. Figure 19b shows the effect of the minimum filter applied to the original image.…”
Section: G Image Processingmentioning
confidence: 99%
“…Standard or add-in software on some X-ray and EM instruments can offer a range of processing options including particle counting, 273 Fourier transform-based convolution methods, 274 and tomographic image visualization, 275 while software associated with some surface analysis techniques may include only basic image manipulations such as rescaling, addition, and subtraction. Although commercial software packages exist to implement most of the processing methods described here, in general, technique-specific requirements are barriers to the average user.…”
Section: Image Transformationsmentioning
confidence: 99%