2012
DOI: 10.1016/j.measurement.2012.01.037
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Automated dimensional inspection planning using the combination of laser scanner and tactile probe

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Cited by 87 publications
(40 citation statements)
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“…Sensor selection for measurement of different features and inspection path planning are the main focuses in this field. Studies of Mohib et al [31] and Zhao et al [32] belong to this field. In…”
Section: Non-contact Blue Led Structured Light Scannermentioning
confidence: 99%
“…Sensor selection for measurement of different features and inspection path planning are the main focuses in this field. Studies of Mohib et al [31] and Zhao et al [32] belong to this field. In…”
Section: Non-contact Blue Led Structured Light Scannermentioning
confidence: 99%
“…Zhao et al outlined a methodology that plans the inspection automatically for CMM with a touch trigger probe and a laser scanner. (12) The methodology is suitable for automatic dimensional measurement. Rahayem et al conducted comparative research including the popular ellipse-fitting methods from the laser profile-scan sections.…”
Section: Introductionmentioning
confidence: 99%
“…This can be considered the biggest advantage of those systems as well as the ability to collect full product information without local part deformation during the inspection [8,9]; hence, CMM systems with laser scanners are more frequently being used [6,10]. The use of laser scanners is well-established in the context of reverse engineering, but they are currently unable to achieve the accuracy and repeatability offered by touch trigger probes.…”
Section: Introductionmentioning
confidence: 99%