Automated handling of bio-nanowires for nanopackaging

Fatikow, Sergej; Bartenwerfer, Malte; Krohs, Florian; Mikczinski, Manuel; Niewiera, F.; Weigel-Jech, Michael; Saketi, Pooya; Kallio, Pasi

doi:10.1109/iros.2010.5649313

Cited by 7 publications

(4 citation statements)

References 32 publications

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“…So the point in Figure 7(b) must be more than 0.85 nm from the nanowire. According to (6), if is bigger than 0.5, we can easily get 2 > 1 . Considering the force between nanowire and substrate, the nanowire will tend to do anticlockwise rotation.…”

Section: Probe Operation Inmentioning

confidence: 99%

“…With it the pose of the micro/nanomaterials can be controlled and material properties can also be researched [1][2][3]. Currently, the mainly visual monitoring devices used in mico/nanomanipulation are atomic force microscopy (AFM) and scanning electron microscopy (SEM) [4][5][6][7]. AFM has the advantages of force detection and imaging, but the feedback results cannot be obtained real time; thus it is not suitable in the real-time environment.…”

Section: Introductionmentioning

confidence: 99%

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OpenCV-Based Nanomanipulation Information Extraction and the Probe Operation in SEM

Song

Wang

et al. 2014

Advances in Mechanical Engineering

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Aimed at the established telenanomanipulation system, the method of extracting location information and the strategies of probe operation were studied in this paper. First, the machine learning algorithm of OpenCV was used to extract location information from SEM images. Thus nanowires and probe in SEM images can be automatically tracked and the region of interest (ROI) can be marked quickly. Then the location of nanowire and probe can be extracted from the ROI. To study the probe operation strategy, the Van der Waals force between probe and a nanowire was computed; thus relevant operating parameters can be obtained. With these operating parameters, the nanowire in 3D virtual environment can be preoperated and an optimal path of the probe can be obtained. The actual probe runs automatically under the telenanomanipulation system's control. Finally, experiments were carried out to verify the above methods, and results show the designed methods have achieved the expected effect.

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Section: Probe Operation Inmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

OpenCV-Based Nanomanipulation Information Extraction and the Probe Operation in SEM

Song

Wang

et al. 2014

Advances in Mechanical Engineering

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“…Recently, research institutes and universities have been involved in new fields of research activities where small force traceability is needed. The activities range from mechanical testing of micro-and nanosystems [1,2], to applications for biomaterials [3,4] and material sciences [5,6] as well as the handling of micrometer-sized samples [7,8]. The use of micromachining techniques has triggered substantial progress in developing new sensors for measuring forces ranging from the micronewton down to a few nanonewton.…”

Section: Introductionmentioning

confidence: 99%

Micro-force measurements: a new instrument at METAS

Marti

Wuethrich

Aeschbacher

et al. 2020

Meas. Sci. Technol.

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We designed and developed a new instrument for calibrating micro-force sensors. The calibration is traceable to the SI unit of mass and is realized from 1 µN–60 mN by means of electromagnetic force compensation of a balance. The expanded measurement uncertainty of our instrument comprises two contributions, an absolute contribution of 0.13 µN and a relative contribution of 2700 ppm. We verified our instrument in a bilateral comparison between METAS and PTB's instruments for forces from 40 µN up to 20 mN. The degrees of equivalence found by the two institutes are in excellent agreement.

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“…Compared to AFM, SEM provides a satisfactory real-time observation function. Numerous scholars employ SEM images as the visual servo to facilitate target location and tracking during nanomanipulation or to enable the study of nanometer materials characteristics [7][8][9].…”

mentioning

confidence: 99%

SEM Image-Based 3-D Nanomanipulation Information Extraction and Closed-Loop Probe Control

Rong

Song

et al. 2014

IEEE Trans. Nanotechnology

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To achieve a scanning electron microscope (SEM) and virtual reality-based nanomanipulation system, this paper addresses 3-D nanomanipulation information extraction based on 2-D SEM images, after briefly explaining how to establish the 3-D virtual environment. An image border repair algorithm based on an eight-neighboring method is proposed to obtain the accurate 2-D coordinates of the probe and nanowire even when they are in contact. To determine the coordinates of the Z probe, a method based on the grayscale standard deviation of 2-D SEM images is proposed. Through these converted coordinates, the model can be updated and controlled in a virtual environment. Finally, a fuzzy proportional-integral-derivative (PID) controller is designed to control the actual probe position and to improve the system accuracy. Simulations and experimental results demonstrate that the system exhibits good output characteristics in either dynamic-state or steady-state, when controlled with the fuzzy PID.

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Automated handling of bio-nanowires for nanopackaging

Cited by 7 publications

References 32 publications

OpenCV-Based Nanomanipulation Information Extraction and the Probe Operation in SEM

OpenCV-Based Nanomanipulation Information Extraction and the Probe Operation in SEM

Micro-force measurements: a new instrument at METAS

SEM Image-Based 3-D Nanomanipulation Information Extraction and Closed-Loop Probe Control

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