2023
DOI: 10.1016/j.actamat.2022.118502
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Automated identification of slip system activity fields from digital image correlation data

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Cited by 18 publications
(1 citation statement)
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“…Recent advances in combining scanning electron microscopy (SEM) with digital image correlation (DIC) (and application of a perfect speckle pattern [19] ) have demonstrated that high-quality microscale or even nanoscale strain fields can be obtained. This opens routes to unravel various nanodeformation and microdeformation mechanisms, such as dislocation slip, [20] twinning, [21] grain boundary interactions [22] and small-scale localisation and damage. [23] However, these examples all deal with conductive materials, for which the performance of SEM is optimal.…”
Section: Introductionmentioning
confidence: 99%
“…Recent advances in combining scanning electron microscopy (SEM) with digital image correlation (DIC) (and application of a perfect speckle pattern [19] ) have demonstrated that high-quality microscale or even nanoscale strain fields can be obtained. This opens routes to unravel various nanodeformation and microdeformation mechanisms, such as dislocation slip, [20] twinning, [21] grain boundary interactions [22] and small-scale localisation and damage. [23] However, these examples all deal with conductive materials, for which the performance of SEM is optimal.…”
Section: Introductionmentioning
confidence: 99%