Automated Parallel Test Forms Assembly using Zero-suppressed Binary Decision Diagrams
Kazuma Fuchimoto,
Shin-Ichi Minato,
Maomi Ueno
Abstract:Recently, through the progress achieved in the study of computer science, automated test assemblies of parallel test forms, for which each form has equivalent measurement accuracy but with a different set of items, have emerged as a new standard tool. An important goal for automated test assembly is to assemble as many parallel test forms as possible. Although many automated test assembly methods exist, maximum clique using the integer programming method is known to be able to assemble the greatest number of a… Show more
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