1992
DOI: 10.1016/0030-4018(92)90606-r
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Automated phase-measuring profilometry using defocused projection of a Ronchi grating

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Cited by 263 publications
(101 citation statements)
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“…Furthermore, a simplified calculation of the relative height can be directly expressed as the production of a coefficient and the phase when the stand off distance S is much larger than the relative height h. (Su et al, 1992) …”
Section: Phase-height Mapping Strategymentioning
confidence: 99%
“…Furthermore, a simplified calculation of the relative height can be directly expressed as the production of a coefficient and the phase when the stand off distance S is much larger than the relative height h. (Su et al, 1992) …”
Section: Phase-height Mapping Strategymentioning
confidence: 99%
“…In the case of white light, interference occurs only when the optical path difference (OPD) between the objective and reference beams is nearly the same (within the coherence length of the light source) so by varying one of the arms we can measure the surface roughness, small height variations and thickness of the microstructures. various schemes in WLI, such as, vertical scanning interferometry (VSI) [16,17], phase shifting interferometry (PSI) [18][19][20][21][22], fringe projection method [23][24][25][26][27], Fourier profilometry [27,28], confocal microscope [29]. In the aforementioned methods Linnik, Michelson and Mirau type interferometric objectives are used [12][13][14].…”
Section: Introductionmentioning
confidence: 99%
“…In a representative system of fringe projection profilometry, the structured fringe patterns are projected on the object using a DMD projector and the distorted fringes are recorded by a charge coupled device (CCD). Many methods such as PMP and FTP apply to the calculation of the phase information of the fringe pattern [10][11][12]. Compared with FTP, although more images are needed, the result of PMP is more accurate since the process of filtering in FTP is avoided.…”
Section: Introductionmentioning
confidence: 99%