“…In the case of white light, interference occurs only when the optical path difference (OPD) between the objective and reference beams is nearly the same (within the coherence length of the light source) so by varying one of the arms we can measure the surface roughness, small height variations and thickness of the microstructures. various schemes in WLI, such as, vertical scanning interferometry (VSI) [16,17], phase shifting interferometry (PSI) [18][19][20][21][22], fringe projection method [23][24][25][26][27], Fourier profilometry [27,28], confocal microscope [29]. In the aforementioned methods Linnik, Michelson and Mirau type interferometric objectives are used [12][13][14].…”