2012
DOI: 10.1109/tcpmt.2011.2182613
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Automated Void Detection in Solder Balls in the Presence of Vias and Other Artifacts

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Cited by 21 publications
(29 citation statements)
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“…We claim that the new ideas mentioned in 2) and 3) are different to previous existing methods (2)(3)(4)(5) .…”
Section: Introductionmentioning
confidence: 79%
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“…We claim that the new ideas mentioned in 2) and 3) are different to previous existing methods (2)(3)(4)(5) .…”
Section: Introductionmentioning
confidence: 79%
“…In typical 2D X-ray images (gray scale image, 0-255 levels), the solder balls are often interfered by other board components (2)(3) , for example some joints normally create some occluded solder balls. Then, the robust segmentation algorithms that are able to deal with different kinds of interfering backgrounds are essentially preferred.…”
Section: Individual Solder Ball Segmentation From the Background Of Imentioning
confidence: 99%
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