“…The features that are traditionally used for CM (RMS, crest factor, kurtosis, …, in the time domain; amplitude of power spectra, band power, envelope, …, in the frequency domain) [4,12,13,14,19,20,21,22,23,24,25], and that are considered in this work, are useful in most applications to maintain the relevant information about the process or tool conditions [4].…”