Automatic mura detection system for liquid crystal display panels

Abstract

In this paper, we propose an automatic inspection system, which can automatically detect four types of muras on an LCD panel: cluster mura, v-band mura, rubbing mura, and light leakage mura. To detect cluster muras, the Laplacian of Gaussian (LOG) filter is used. A multi-resolution approach is proposed to detect cluster muras of different scales. To speed up the processing speed, this multi-resolution approach is actually implemented in the frequency domain. To detect v-band muras, we check the variation tendency of the projected 1-D intensity profile. Then, v-band muras are detected by identifying these portions of the 1-D profile where a large deviation occurs. To detect rubbing muras, we designed a frequency mask to detect distinct components in the frequency domain. To detect light leak muras, we apply image mirroring over the boundary parts and adopt the same LOG filter that has been used in detecting cluster muras. All four types of mura detection are integrated together in an efficient way and simulation results demonstrate that this system is indeed very helpful in detecting mura defects.

Lens Inspection System Using LoG and Multi-level Thresholds

“…That defect detection is difficult because the difference of intensity between the defect itself and its background is comparatively very low. As typical researches of these, there were the method [4] that used a local threshold binarization technique and the method [5] that used multiple LoG (Laplacian of Gaussian) masks.…”