2016
DOI: 10.1515/amcs-2016-0045
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Automatic parametric fault detection in complex analog systems based on a method of minimum node selection

Abstract: The aim of this paper is to introduce a strategy to find a minimal set of test nodes for diagnostics of complex analog systems with single parametric faults using the support vector machine (SVM) classifier as a fault locator. The results of diagnostics of a video amplifier and a low-pass filter using tabu search along with genetic algorithms (GAs) as node selectors in conjunction with the SVM fault classifier are presented. General principles of the diagnostic procedure are first introduced, and then the prop… Show more

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Cited by 10 publications
(6 citation statements)
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“…Note that similar analysis must be performed for every circuit separately. For larger circuits, automated node selection methods are proposed [35]. The presented experiments show usefulness of the RBF network as the parametric fault classifier.…”
Section: Experimental Examplementioning
confidence: 91%
“…Note that similar analysis must be performed for every circuit separately. For larger circuits, automated node selection methods are proposed [35]. The presented experiments show usefulness of the RBF network as the parametric fault classifier.…”
Section: Experimental Examplementioning
confidence: 91%
“…Support vector machines. Support vector machines (SVMs), which often belong to the most effective general-purpose classification algorithms (e.g., Hamel, 2009;Cichosz, 2015;Bilski and Wojciechowski, 2016), can be viewed as a considerably strengthened version of a basic linear-threshold classifier with the following enhancements (Cortes and Vapnik, 1995;Platt, 1998): margin maximization: the location of the decision boundary (separating hyperplane) is optimized with respect to the classification margin;…”
Section: 3mentioning
confidence: 99%
“…The procedure for other similar circuits (such as other filters) should be the same. If the system is more complex, more sophisticated node selection method should be used [27].…”
Section: Testability Verificationmentioning
confidence: 99%