Automating Quality Systems

Tannock, J. D. T.

doi:10.1007/978-94-011-2366-2

Cited by 13 publications

(4 citation statements)

References 9 publications

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“…It has been reported that about 80% of the existing industrial vision systems are used primarily for inspection tasks (Tannock, 1992). It has been reported that about 80% of the existing industrial vision systems are used primarily for inspection tasks (Tannock, 1992).…”

Section: Vision Inspectionmentioning

confidence: 99%

A Virtual System for Vision Based SPC

Xie

Zhang

2005

Quality Engineering

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A virtual system for vision based SPC (Statistical Process Control) is explored and constructed in this article for the purpose of the preliminary tests. Its performance is compared with that of a real vision system in a case study. The similarity between the virtual and real systems is examined with a chi-square test and an X chart experiment. The results suggest that the virtual system can be used to replace the real system in the preliminary test. The virtual system has many advantages, such as low cost, easy setup, wide adaptability, and being heuristic in nature. The use of the virtual system may help promote the applications of vision system to SPC.

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Section: Vision Inspectionmentioning

confidence: 99%

A Virtual System for Vision Based SPC

Xie

Zhang

2005

Quality Engineering

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“…In some industries and enterprises, these principles have been automated, offering greater speed and accuracy of data capture and analysis (Tannock, 1992). These are described by sector 1 in Figure 2, as organisations using simple processes to operate within stable markets (Puttick, 1990).…”

Section: Definitionsmentioning

confidence: 99%

Implementing an industrial continuous improvement system: a knowledge management case study

Beckett

Wainwright

Bance

2000

Industrial Management &Amp; Data Systems

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Describes the practical application, in an industrial setting, of an information system designed to support continuous improvements. This system, based on a quality monitoring system, differs from conventional application in that it seeks to support both quality conformance and continuous improvements to design and research activities. Such activities traditionally fall outside the quality management function, but are encompassed within knowledge management goals and techniques, which are used in this research to construct a system framework. The integration of information into functional areas previously unlinked to manufacturing issues is illustrated as the major obstacle which had to be overcome. The implications for management practices are subsequently described. Concludes that knowledge management principles can support a wider application of continuous improvement to obtain benefits for the organisation, by providing higher quality information, and increasing the levels of organisational expertise which can be applied to it.

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“…The system was also required to enable input-parameter SPC. It is widely known that the preferred feedback and control system is one that provides information in time to prevent nonconformance, and not one that shows non-conformance in an output [2]. Normal processing on the track was required to halt until properly addressed and corrected.…”

Section: Solution Requirementsmentioning

confidence: 99%

Sensorization in a photolithography coat process

McCaslin

Proceedings of SEMI Advanced Semiconductor Manufacturing Conference and Workshop

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The growth of automation and automatic data collection in the semiconductor industry is providing engineers and manufacturers with an unprecedented insight into their processes and is crucial in the trend toward higher quality and error free processing[ 11. Some of the immediate benefits of automation are real time monitoring of process conditions, reduction in equipment downtime due to qualification testing, real time Statistical Process Control (SPC), elimination of operator induced error in equipment measurements, and process risk reduction[ 11, These benefits and others were realized through the implementation of a real time temperature monitoring system on a photolithography coat track. The system provides full time temperature monitoring, automatic SPC data logging during actual process conditions, state driven control of track interlock to prevent out of limit processing and process data tracking for real time performance of wafer bake stations. The system was realized by implementing a C-based state logic program in the QNX Windows real time operating system to drive Keithley METRABUS hardware monitoring SVG 8600 coat tracks.

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Automating Quality Systems

Cited by 13 publications

References 9 publications

A Virtual System for Vision Based SPC

A Virtual System for Vision Based SPC

Implementing an industrial continuous improvement system: a knowledge management case study

Sensorization in a photolithography coat process

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