2016
DOI: 10.1002/pssb.201600464
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Background impurities in Si0.8Ge0.2/Si/Si0.8Ge0.2n-type δ-doped QW

Abstract: Additional (residual) impurities in the barriers change the energy profile of a quantum well. This means that they alter the ionization energy for the impurity delta layer situated within the quantum well. In turn, this is accompanied by the change of a V‐shaped quantum well created by ionization of the delta layer. All of this is the subject of studies presented in this article. It has been shown that the most dramatic are the changes in the difference between the space‐quantized energy levels for an edge‐dop… Show more

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Cited by 2 publications
(11 citation statements)
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“…Here it has to be noted that in our earlier work [38] the data on the higher concentration were reported. It will be seen below, in the part 4 that a smaller concentration allows one to estimate a possible dynamic range of changing both IBEs and energy gaps between couples of neighboring space-quantized energy levels with changing concentration of the delta layer.…”
Section: About Delta Layermentioning
confidence: 68%
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“…Here it has to be noted that in our earlier work [38] the data on the higher concentration were reported. It will be seen below, in the part 4 that a smaller concentration allows one to estimate a possible dynamic range of changing both IBEs and energy gaps between couples of neighboring space-quantized energy levels with changing concentration of the delta layer.…”
Section: About Delta Layermentioning
confidence: 68%
“…It means that the Si QW can be considered as subjected to the uniaxial strain along the growth direction z of the structure. This results in that the degeneracy of electron valleys in the conduction band of Si is removed and in our case of [100] growth direction the splitting between the four upper in energy valleys Δ 4 and two others Δ 2 is more than 110 meV [37,38,42]. In turn, such big splitting allows us to consider only the two lowest valleys (even at temperature T=300 K -see below) with the effective masses along the layer = m m 0.19 0  , and in the growth direction = m m 0.92 0 with m 0 being the free electron mass.…”
Section: Qw and Its Parametersmentioning
confidence: 85%
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