1978
DOI: 10.1021/ac50030a055
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Background subtract subroutine for spectral data

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Cited by 34 publications
(12 citation statements)
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“…Problem Modeling. We denote the Raman intensities of an N-point Raman spectrum as y = ( y 1 , …, y N ) and y = b + p + n , in which b is the baseline of the Raman spectrum, which needs to be corrected and is usually modeled as a p -order polynomial because polynomial fitting for the baseline satisfies most spectra; 27,30 p is the positive gathering peaks in the Raman spectrum, which have different shapes, amplitudes, positions, and widths; and n is the physical noise and model uncertainties, which are modeled here as a white Gaussian and additive noise with variance σ 2 .…”
Section: Methodsmentioning
confidence: 99%
“…Problem Modeling. We denote the Raman intensities of an N-point Raman spectrum as y = ( y 1 , …, y N ) and y = b + p + n , in which b is the baseline of the Raman spectrum, which needs to be corrected and is usually modeled as a p -order polynomial because polynomial fitting for the baseline satisfies most spectra; 27,30 p is the positive gathering peaks in the Raman spectrum, which have different shapes, amplitudes, positions, and widths; and n is the physical noise and model uncertainties, which are modeled here as a white Gaussian and additive noise with variance σ 2 .…”
Section: Methodsmentioning
confidence: 99%
“…Many studies have been carried out on baseline shifting, which is one of the most important processes in spectrum analysis. [10][11][12][13][14][15][16][17][18] Although baseline correction methods have improved over time, the total elimination of the residual baseline error is still not guaranteed. The bias from the residual baseline error affects the signal at wavenumbers with low absorbance more than those with high absorbance.…”
Section: Theorymentioning
confidence: 99%
“…The first step in the separation involved establishing an interference matrix including variance due to other components and instrumental noise. Diffraction patterns from samples having zero concentration of the constituent of interest (j) and background eliminated [29] pure component patterns (from either CLS regression vectors or XRPD scans) were modeled via singular value decomposition (SVD). Loadings explaining high variance in the interference matrix (while exhibiting low correlation to the component of interest (k)) were retained for the interference basis set X −j .…”
Section: Separation Of Multi-component Diffraction Patternsmentioning
confidence: 99%
“…The first interference matrix contains diffraction patterns from samples containing zero concentration of the constituent of interest and background eliminated [29] pure component patterns. The reason for eliminating the background should become apparent when considering the disordered components.…”
Section: Diffraction Pattern Separationmentioning
confidence: 99%