1998
DOI: 10.1364/ao.37.005985
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Backscatter linear and circular polarization analysis of roughened aluminum

Abstract: A study of cross-polarized and copolarized intensities backscattered from roughened aluminum surfaces is presented for both linear and circular incident polarization states. The angular variation of measured Mueller matrices is shown to contain only diagonal elements, as predicted by the reciprocity theorem. The ratio of cross-depolarized to copolarized scattered intensities is significantly larger for circular than for linear input polarization states. In the linear case the ratio saturates beyond 50 degrees … Show more

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Cited by 28 publications
(18 citation statements)
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“…In addition, the experiment is conveniently modified by use of wave plates to investigate scattering for different polarization states (e.g. circular) [16] of the transmit laser beam.…”
Section: Discussionmentioning
confidence: 99%
“…In addition, the experiment is conveniently modified by use of wave plates to investigate scattering for different polarization states (e.g. circular) [16] of the transmit laser beam.…”
Section: Discussionmentioning
confidence: 99%
“…This is consistent with other reported results for similar sample types under similar measurement conditions. [8][9][10][11] Therefore, we will focus on the m 11 , m 22 , and m 33 diagonal components for the remaining analysis in this paper. …”
Section: Experiments Limitationsmentioning
confidence: 99%
“…For the optical/IR measurements, three bead-blasted and an unmodified aluminum surface were investigated 13,14 . The three aluminum surfaces (240mm x 130mm x 3mm) were bead-blasted at 5psi, 15psi and 90psi air pressures with 30µm alumina spheres.…”
Section: Aluminum Surface Characterizationmentioning
confidence: 99%
“…Table 2 shows how these physical parameters translate into roughness compared to a wavelength of the probing radiation. We shall consider data at two wavelengths, 0.6 and 10.6 µm, which match the experimental facilities 13,14 . We shall investigate whether the parameter ks can be recovered from the scattered field data using equation 12, which itself was obtained from the microwave experiments of figure 6.…”
Section: Aluminum Surface Characterizationmentioning
confidence: 99%