Bake enhanced erratic behavior in gate stress characteristics in flash memories

Tao, Guoqiao; Scarpa, A.; Marwijk, L. van; Dormans, D.

doi:10.1109/relphy.2005.1493092

2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.

DOI: 10.1109/relphy.2005.1493092

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Bake enhanced erratic behavior in gate stress characteristics in flash memories

Guoqiao Tao

A. Scarpa

L. van Marwijk

et al.

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Bake enhanced erratic behavior in gate stress characteristics in flash memories

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References 15 publications

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