Thick epitaxial layers of AlSb͑Si͒ and AlSb͑Be͒ were grown by molecular beam epitaxy and characterized by variable-temperature Hall/van der Pauw measurements. Si is shown to be predominantly an acceptor in AlSb, with an energy level 33Ϯ4 meV above the top of the valence band. Be is also an acceptor, with an energy level 38Ϯ4 meV above the top of the valence band. Be is a robust doping source for p-AlSb for carrier densities ranging from 10 15 to 10 19 cm Ϫ3 . Background impurity levels in AlSb can be assessed by measuring the transport properties of lightly doped AlSb͑Be͒ layers.