Ballistic Impact Testing of Aluminum 2024 and Titanium 6Al-4V for Material Model Development

Pereira, J. Michael; Revilock, Duane M.; Ruggeri, Charles R.; Emmerling, William; Altobelli, Donald J.

doi:10.1061/9780784412190.135

Cited by 9 publications

(1 citation statement)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Their results showed that deformations could be measured within ±25 mm from 220 m away. Similar applications of this method have been reported for impact testing, as well as monitoring the main rotor of a helicopter in both grounded and hovering operation conditions .…”

Section: Introductionmentioning

confidence: 65%

Full‐field deformation measurements during seismic loading of masonry buildings

Rajaram

Vanniamparambil

Khan

et al. 2016

Struct. Control Health Monit.

View full text Add to dashboard Cite

This article demonstrates the potential of the digital image correlation (DIC) method to provide accurate full-field deformation measurements and successfully monitor the development of damage during seismic excitation of a partially grouted reinforced masonry building. The building was subjected to a sequence of earthquake ground motion records using the Large High Performance Outdoor Shake Table at the University of California, San Diego. The DIC setup was capable of measuring surface deformations of the single-story building with high frame rate cameras located at a distance greater than 50 ft away. The accuracy of the measurements was assessed with data obtained using mounted displacement transducers. The full-field deformation data collected by the DIC system was capable to detect strain localization patterns associated with the onset of wall cracking before it could be shown by the displacement sensor data or by post mortem visual inspection. The research findings reported herein demonstrate, for the first time to the authors' best knowledge, the potential of in situ monitoring of actual structures for damage induced by non-stationary loading profiles using optical metrology.

show abstract

Section: Introductionmentioning

confidence: 65%