We successfully prepared ZnCuGaSe2 (Zn2xCu1−xGa1−xSe2, ZCGSe) thin films as a novel wide-gap absorber for a top cell. The bandgap of ZCGSe films was controlled from 1.66 to 1.80 eV by incorporating Zn into CuGaSe2 (CGSe, x from 0 to 0.4). The X-ray diffraction (XRD) peaks of ZCGSe films with the Zn/(Zn + Cu + Ga) (Zn/Metal) ratio of the film of less than 0.3 were similar to those of CGSe, and impurity phases such as Ga2Se3 and ZnSe were not observed. However, the peaks related to ZnSe were observed in the film with the Zn/Metal ratio of 0.4. Current–voltage (I–V) characteristics showed that efficiencies were almost the same at the Zn/Metal ratio of the films from 0.1 to 0.3. The open-circuit voltage (VOC) increased to 0.91 V with increasing Zn/Metal ratio of the film. However, the efficiency and short-circuit current density (JSC) steeply decreased when the Zn/Metal ratio of the film was more than 0.35. The elemental depth profiles and the electron-beam-induced current (EBIC) images showed that carriers excited in a Zn-rich layer near the surface were recombined in the film with the bulk Zn/Metal ratio of 0.4. These results suggest that the upper Zn-rich layer consists of n-type ZnSe and the JSC is decreased owing to carrier recombination. The best cell performance obtained was an efficiency of 9.0% (VOC = 0.90 V, JSC = 15.3 mA/cm2, FF = 0.65) achieved by the ZCGSe solar cell with the bandgap of 1.7 eV without an anti-reflection (AR) coating at the Zn/Metal ratio of 0.3.