2006
DOI: 10.1016/j.ssc.2006.04.016
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Bandwidth control effects in electron doped manganite La0.7−xYxCe0.3MnO3 thin films

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Cited by 8 publications
(4 citation statements)
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“…One can see in this table that cell volume, bond length d Mn-O and bond angle θ Mn-O-Mn exhibit only a slight decrease, with the increase of Na, due to the small size of Na substituting the bigger Ba ion and especially to the important loss of Na. This is consistent with recent works [12,13] showing that lattice parameters are mainly affected by the size effect of A perovskite site, inducing a significant change in the Mn-O-Mn bond angle.…”
Section: Methodssupporting
confidence: 93%
“…One can see in this table that cell volume, bond length d Mn-O and bond angle θ Mn-O-Mn exhibit only a slight decrease, with the increase of Na, due to the small size of Na substituting the bigger Ba ion and especially to the important loss of Na. This is consistent with recent works [12,13] showing that lattice parameters are mainly affected by the size effect of A perovskite site, inducing a significant change in the Mn-O-Mn bond angle.…”
Section: Methodssupporting
confidence: 93%
“…The decrease of T C is mainly attributed to a decrease of the Mn-O-Mn bond angle due to decrease of the mean ionic radius r A of the A-site cation. This is consistent with the decrease of the carrier bandwidth (W) of the e g band resulting from an overlap between 3d orbitals of the metallic ions and 2p orbitals of the oxygen ions [25]. In addition to the mentioned decrease of T C with increasing Fe concentration, the transition width also increases quite appreciably with increasing Fe concentration, suggesting suppression of the double-exchange mechanism.…”
Section: Magnetic Propertiessupporting
confidence: 82%
“…The LCeMO films were characterized by energy dispersive spectroscopy and x-ray diffraction analysis, described elsewhere [27]. The thickness of the films is 120 nm.…”
Section: Resultsmentioning
confidence: 99%
“…The La 0.7 Ce 0.3 MnO 3 films were grown on (001) LaAlO 3 (LAO) substrate by the pulsed laser deposition technique. The sample preparation and characterization are described elsewhere [27]. The resistance was determined as a function of temperature for various dc currents in the absence of magnetic field by using a conventional four-probe method in a closed cycle cryostat.…”
Section: Methodsmentioning
confidence: 99%