Basic Interactions

Bauer, E.

doi:10.1007/978-1-4939-0935-3_2

Cited by 2 publications

(3 citation statements)

References 196 publications

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“…Recently, promising progress has been made in calculation and measurements from X-ray absorption spectra [ 9 ]. Nevertheless, the experimental values of the IMFP in the low-energy range are rarely reported [ 10 , 11 , 12 ].…”

Section: Introductionmentioning

confidence: 99%

Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer

et al. 2021

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The detailed examination of electron scattering in solids is of crucial importance for the theory of solid-state physics, as well as for the development and diagnostics of novel materials, particularly those for micro- and nanoelectronics. Among others, an important parameter of electron scattering is the inelastic mean free path (IMFP) of electrons both in bulk materials and in thin films, including 2D crystals. The amount of IMFP data available is still not sufficient, especially for very slow electrons and for 2D crystals. This situation motivated the present study, which summarizes pilot experiments for graphene on a new device intended to acquire electron energy-loss spectra (EELS) for low landing energies. Thanks to its unique properties, such as electrical conductivity and transparency, graphene is an ideal candidate for study at very low energies in the transmission mode of an electron microscope. The EELS are acquired by means of the very low-energy electron microspectroscopy of 2D crystals, using a dedicated ultra-high vacuum scanning low-energy electron microscope equipped with a time-of-flight (ToF) velocity analyzer. In order to verify our pilot results, we also simulate the EELS by means of density functional theory (DFT) and the many-body perturbation theory. Additional DFT calculations, providing both the total density of states and the band structure, illustrate the graphene loss features. We utilize the experimental EELS data to derive IMFP values using the so-called log-ratio method.

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Section: Introductionmentioning

confidence: 99%

Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer

et al. 2021

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“…The results of the two experiments are linked via the Fowler–DuBridge theory. − The technical details of both used techniques and the raw data are presented in the Supporting Information. According to the Fowler–DuBridge theory, − the electron yield is proportional to the current density J induced by illuminating the sample with photons of energy h ν where the parameter B depends on the photon flux and the geometrical design of the PEEM, T denotes the thermodynamic temperature, and k B is the Boltzmann constant. During a deposition experiment, it is safe to assume that B and T do not change.…”

Section: Results and Discussionmentioning

confidence: 99%

“…The last expression represents a series expansion that is valid for low temperatures (neglecting higher-order terms) Equation can be applied to corresponding pixels with coordinates ( x , y ) of a series of N images acquired during the growth of an ultrathin organic film.…”

Section: Results and Discussionmentioning

confidence: 99%

Attenuation of Photoelectron Emission by a Single Organic Layer

Wagner

Zeppenfeld

2022

ACS Appl. Mater. Interfaces

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We report an in situ study of the thin-film growth of cobalt-phthalocyanine on Ag(100) surfaces using photoelectron emission microscopy (PEEM) and the Anderson method. Based on the Fowler–DuBridge theory, we were able to correlate the evolution of the mean electron yield acquired with PEEM for coverages up to two molecular layers of cobalt-phthalocyanine to the global work function changes measured with the Anderson method. For coverages above two monolayers, the transients measured with the Anderson method and those obtained with PEEM show different trends. We exploit this discrepancy to determine the inelastic mean free path of the low-energy electrons while passing through the third layer of CoPc.

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Basic Interactions

Cited by 2 publications

References 196 publications

Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer

Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer

Attenuation of Photoelectron Emission by a Single Organic Layer

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