Basics of electron transport over insulators

Zwart, S.T. de; Gorkom, G.G.P. van; Hendriks, B.H.W.; Lambert, N.; Trompenaars, P.H.F.

doi:10.1016/s0165-5817(97)84678-5

Cited by 24 publications

(13 citation statements)

References 11 publications

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“…For the Zeus display knowledge of the mechanism of the transport of electrons along the surface of insulators by means of 'hopping' is very important [ 1,2]. The hopping behaviour is mainly determined by the secondary emission parameters of the insulator on which this hopping takes place.…”

Section: Introductionmentioning

confidence: 99%

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Secondary electron emission properties

Scholtz

Dijkkamp

Schmitz

1996

Philips Journal of Research

139

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In this paper an introduction is given to secondary electron emission properties. It is shown that the reduced secondary emission yield 15/b, as a function of the reduced primary energy Ep/Em can be described by a universal curve. It is found that it is easier to use the measurement of the maximum secondary electron emission 6, and the energy E,,, at which this maximum is reached to determine the suitability of a coating for use in the display than direct measurement of the first crossover energy EI. The value of 6, and E,,, can be used to derive EI. Furthermore, it is observed that in any material the elastic fraction of the secondary electrons exhibits a universal behaviour as a function of Ep. Fits to S(EJ and the energy distribution of the secondary electrons are proposed which can be used in Monte Carlo simulations.

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Section: Introductionmentioning

confidence: 99%

“…These parameters are of major influence on the electric field (the 'transport field') needed to transport electrons along the channels by means of the hopping mechanism [ 1,2]. In general it is found that a small value for EI results in a small value for the minimal transport field.…”

Section: Introductionmentioning

confidence: 99%

Secondary electron emission properties

Scholtz

Dijkkamp

Schmitz

1996

Philips Journal of Research

139

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“…no deviation). This result is interpreted on the basis of the secondary electron emission model [2,3]. The spacer is made of glass material and the energy of primary electron hitting the spacer is in the range where δ, the coefficient of secondary electron emission could be <1 or >1.…”

Section: Figure 4 -Untreated Glass Spacermentioning

confidence: 98%

Charging and reliability effects associated with FED spacers

Tirard-Gatel

Perrin

Lévy

et al. 1999

Symp Digest of Tech Papers

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A low cost scalable spacer technology is required for the commercial development of medium and high voltage FED products. Various techniques can be used to shape glass into high aspect ratio spacers. In this paper, we will describe and interpret the short term effects associated with charging under electron bombardment, as well as the long term reliability effects such as flashover and image degradation, under 5 V / micron anode fields.

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“…When the impacting energy of electron is near to E i2 , a continuous multiplication or decline of positive charge density is more likely to occur, which is not stable. 5,9,10 In this SSEE state, electrons emitted from CTJ and secondary electrons emitted from surface will impact the surface continually, and they move towards anode but not lead to flashover. It is critical that the energy of an electron to make r being unity is about several tens of eV, 11,12 which is much higher than the band gap of general insulators (several eV).…”

Section: Theoretical Analysis On Ssee and Related Surface Charginmentioning

confidence: 99%

Theoretical and simulation research on self-stabilizing secondary electron emission process across solid dielectrics in vacuum

Zhan

Huang

et al. 2013

Journal of Applied Physics

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Recently, the cathode-like luminescence phenomena are observed from the surface of solid dielectrics under steady-state high voltage excitation in vacuum, which is closely related to the self-stabilizing secondary electron emission (SSEE) occurring on insulator surface. In this paper, the theoretical analysis about surface charging based on the SSEE is made, and a one-dimensional Mont Carlo simulation on surface charge accumulation under DC voltage excitation is provided. The results reveal that surface charging process can be divided into three stages including initial accumulation, fast multiplication, and final stable stage. In the final stage, the SSEE phenomena are achieved and surface charges are invariable and reach up to a stable distribution. The simulated stable surface charge distribution is consistent with the theoretical deduction results, which confirms the existence of SSEE process.

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Basics of electron transport over insulators

Cited by 24 publications

References 11 publications

Secondary electron emission properties

Secondary electron emission properties

Charging and reliability effects associated with FED spacers

Theoretical and simulation research on self-stabilizing secondary electron emission process across solid dielectrics in vacuum

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