2017
DOI: 10.1109/tmech.2016.2625309
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Batch-to-Batch Rational Feedforward Control: From Iterative Learning to Identification Approaches, With Application to a Wafer Stage

Abstract: DOI to the publisher's website.• The final author version and the galley proof are versions of the publication after peer review.• The final published version features the final layout of the paper including the volume, issue and page numbers. Link to publication General rightsCopyright and moral rights for the publications made accessible in the public portal are retained by the authors and/or other copyright owners and it is a condition of accessing publications that users recognise and abide by the legal re… Show more

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Cited by 78 publications
(39 citation statements)
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“…The iteration approach allows large changes in input updates in frequency regions where the model uncertaintly is small. No changes or small changes in the in the input updates are used if the predicted model uncertainty is large [25]- [27].…”
Section: Introductionmentioning
confidence: 99%
“…The iteration approach allows large changes in input updates in frequency regions where the model uncertaintly is small. No changes or small changes in the in the input updates are used if the predicted model uncertainty is large [25]- [27].…”
Section: Introductionmentioning
confidence: 99%
“…For an application to the wafer stage of Fig. 1(a), see (102) . The theoretical framework is further extended towards input shaping (103) and rational feedforward structures in (104)- (106) , which have as key advantage that these can exactly compensate non-minimum phase dynamics, see (107) for a detailed exposition, and also (95) (108) (109) for further details and applications.…”
Section: Flexible Tasksmentioning
confidence: 99%
“…Based on measured sensor information, the controller predicts the spatio-temporal behavior (either locally at the performance location or globally), and determines a suitable force profile for accurately positioning the stage and its internal flexible dynamics for identification of models for feedforward, where the answer lies in identifying the inverse system directly using instrumental variable system identification (112) . For a detailed comparison to ILC-based approaches, see (102) . Notice that in ILC, the identification criterion for the model, which is needed to construct the learning filter, is slightly different and should be chosen such that the model error is less than 100% in the relevant frequency range of interest, see (93) for details in this direction.…”
Section: Flexible Tasksmentioning
confidence: 99%
“…System inversion is at the heart of achieving high performance in many control applications, including printing systems [1], atomic force microscopes [2], and wafer stages [3]. It is extensively used in, for example, inverse model feedforward [4] and iterative learning control (ILC) [5].…”
Section: Introductionmentioning
confidence: 99%